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Non-negative matrix factorization for mining big data obtained using four-dimensional scanning transmission electron microscopy
Description/Abstract:
Scientific instruments for material characterization have recently been improved to yield big data. For instance, scanning transmission e...
Keyword:
electron microscopy
,
four-dimensional scanning transmission electron microscopy
, and
non-negative matrix factorization
Resource Type:
Article
Author:
Fumihiko Uesugi
,
Shogo Koshiya
,
Jun Kikkawa
,
Takuro Nagai
,
Kazutaka Mitsuishi
, and
Koji Kimoto
Journal:
Ultramicroscopy
Date Uploaded:
02/08/2022
Date Modified:
03/08/2022
Fast electron damage mechanism of epoxy resin studied by electron energy loss spectroscopy and electron diffraction
Description/Abstract:
The damage mechanism and exposure tolerance of epoxy resins to fast electrons remain unclear. We quantitatively investigated the effec...
Keyword:
electron energy loss spectroscopy
,
epoxy resin
,
fast electron damage
, and
π electron
Resource Type:
Article
Author:
Jun Kikkawa
,
Aoi Nii
,
Yoshiaki Sakaniwa
,
Naochika Kon
,
Marina Sakamaki
,
Touyou Ohashi
,
Nobuyasu Nita
,
Koji Harano
, and
Koji Kimoto
Journal:
JOURNAL OF CHEMICAL PHYSICS
Date Uploaded:
01/12/2023
Date Modified:
01/12/2023
Unsupervised machine learning combined with 4D scanning transmission electron microscopy for bimodal nanostructural analysis
Description/Abstract:
Unsupervised machine learning techniques have been combined with scanning transmission electron microscopy (STEM) to enable comprehensive...
Keyword:
4D-STEM
,
Hierachical Clustering
,
Metallic Glass
,
Non-negative Matrix Factorization
,
Scanning Transmission Electron Microscopy
, and
Unsupervised Machine Learning
Resource Type:
Article
Author:
Koji Kimoto
,
Jun Kikkawa
,
Koji Harano
,
Ovidiu Cretu
,
Yuki Shibazaki
, and
Fumihiko Uesugi
Journal:
Scientific Reports
Date Uploaded:
15/02/2024
Local defect and mid-gap state analysis of GaN using monochromated EELS combined with nanodiffraction and atomic-resolution imaging
Description/Abstract:
Enhancement of energy resolution due to evolution of monochromators has made electron energy loss spectroscopy (EELS) in transmission ele...
Keyword:
4D-STEM
,
ABF-STEM
,
EELS
,
GaN
,
HAADF-STEM
,
HAXPES
, and
defect
Resource Type:
Article
Author:
Shunsuke Yamashita
,
Sei Fukushima
,
Jun Kikkawa
,
Ryoji Arai
,
Yuya Kanitani
,
Koji Kimoto
, and
Yoshihiro Kudo
Journal:
APL Materials
Date Uploaded:
19/03/2024
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4
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4
Rights Statement Sim
Creative Commons BY Attribution 4.0 International
2
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Jun Kikkawa
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