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Filtering by: Author Jun Kikkawa Keyword Scanning Transmission Electron Microscopy

Unsupervised machine learning combined with 4D scanning transmission electron microscopy for bimodal nanostructural analysis

Description/Abstract:

Unsupervised machine learning techniques have been combined with scanning transmission electron microscopy (STEM) to enable comprehensive...

Keyword:

4D-STEM, Hierachical Clustering, Metallic Glass, Non-negative Matrix Factorization, Scanning Transmission Electron Microscopy, and Unsupervised Machine Learning

Resource Type:

Article

Author:

Koji Kimoto, Jun Kikkawa, Koji Harano, Ovidiu Cretu, Yuki Shibazaki, and Fumihiko Uesugi

Journal:

Scientific Reports

Date Uploaded:

15/02/2024