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Filtering by: Author Fumihiko Uesugi Author Jun Kikkawa Keyword Scanning Transmission Electron Microscopy

1. Unsupervised machine learning combined with 4D scanning transmission electron microscopy for bimodal nanostructural analysis

Description/Abstract:: Unsupervised machine learning techniques have been combined with scanning transmission electron microscopy (STEM) to enable comprehensive...
Keyword:: 4D-STEM, Hierachical Clustering, Metallic Glass, Non-negative Matrix Factorization, Scanning Transmission Electron Microscopy, and Unsupervised Machine Learning
Resource Type:: Article
Author:: Koji Kimoto, Jun Kikkawa, Koji Harano, Ovidiu Cretu, Yuki Shibazaki, and Fumihiko Uesugi
Journal:: Scientific Reports
Date Uploaded:: 15/02/2024