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Filtering by: Author Fumihiko Uesugi Author Jun Kikkawa Author Koji Harano Publisher Springer Science and Business Media LLC

Unsupervised machine learning combined with 4D scanning transmission electron microscopy for bimodal nanostructural analysis

Description/Abstract:

Unsupervised machine learning techniques have been combined with scanning transmission electron microscopy (STEM) to enable comprehensive...

Keyword:

4D-STEM, Hierachical Clustering, Metallic Glass, Non-negative Matrix Factorization, Scanning Transmission Electron Microscopy, and Unsupervised Machine Learning

Resource Type:

Article

Author:

Koji Kimoto, Jun Kikkawa, Koji Harano, Ovidiu Cretu, Yuki Shibazaki, and Fumihiko Uesugi

Journal:

Scientific Reports

Date Uploaded:

15/02/2024