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Filtering by: Author 田沼繁夫 Keyword information depth Publisher National Institute for Materials Science

電子分光法における表面感度と検出深さ

Description/Abstract:

The four physical parameters describing inelastic scattering of electrons, which is a measure of surface sensitivity, were described. The...

Keyword:

inelastic mean free path, effective attenuation length, information depth, mean escape depth, and surface sensitivity

Resource Type:

Article

Author:

田沼繁夫

Date Uploaded:

01/02/2023

Date Modified:

01/05/2024