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Filtering by: Characterization methods spectroscopy -- x-ray absorption spectroscopy Keyword Pure metal Keyword Silicon (wafer)

XAFS spectrum of Silicon (wafer)

Description/Abstract:

This dataset consists of X-ray absorption fine structure (XAFS) spectra at Si K-edge of Silicon (wafer) measured at Ritsumeikan-SR BL-10,...

Keyword:

BL-10, Pure metal, Ritsumeikan-SR, Si, Si K-edge, Silicon (wafer), XAFS, and collection - MDR XAFS DB

Resource Type:

Dataset

Data origin:

experiments

Date Uploaded:

08/06/2022