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Filtering by: Characterization methods spectroscopy -- x-ray absorption spectroscopy Keyword Carbide Keyword SiC Visibility open

1. XAFS spectrum of Silicon carbide

Description/Abstract:: This dataset consists of X-ray absorption fine structure (XAFS) spectra at Si K-edge of Silicon carbide measured at Ritsumeikan-SR BL-10,...
Keyword:: BL-10, Carbide, Ritsumeikan-SR, Si K-edge, SiC, Silicon carbide, XAFS, and collection - MDR XAFS DB
Resource Type:: Dataset
Data origin:: experiments
Date Uploaded:: 08/06/2022