Index Catalog // MDR

Description/Abstract:: GaN has attracted attention as a semiconductor material for next-generation power switching devices. Vertical-type GaN devices with MOS g...
Keyword:: atom probe tomography, gallium nitride, and transmission electron microscopy
Resource Type:: ProceedingsArticle
Author:: Ryo Tanaka, Shinya Takashima, Katsunori Ueno, Masahiro Horita, Jun Suda, Jun Uzuhashi, Tadakatsu Ohkubo, and Masaharu Edo
Date Uploaded:: 19/04/2024

Description/Abstract:: This paper reviews quantitative characterization via transmission electron microscopy (TEM) and its application to interfacial phenomena ...
Keyword:: electron energy loss spectroscopy, energy dispersive X-ray spectroscopy, grain boundary, interphase boundary, and transmission electron microscopy
Resource Type:: Article
Author:: Seiichiro Ii
Journal:: Materials
Date Uploaded:: 02/04/2024

Description/Abstract:: Injecting high-energy heavy ions in the electronic stopping regime into solids can create cylindrical damage zones calledlatention tracks...
Keyword:: C60 ion, diamond, ion track, transmission electron microscopy, and velocity effect
Resource Type:: Article
Author:: H. Amekura, A. Chettah, K. Narumi, A. Chiba, Y. Hirano, K. Yamada, S. Yamamoto, A. A. Leino, F. Djurabekova, K. Nordlund, N. Ishikawa, N. Okubo, and Y. Saitoh
Journal:: Nature Communications
Date Uploaded:: 04/03/2024

Description/Abstract:: We used atomic-scale direct observations by transmission electron microscopy (TEM) and atom probe tomography to clarify the crystallograp...
Keyword:: atom probe tomography, gallium nitride, and transmission electron microscopy
Resource Type:: Article
Author:: Emi Kano, Keita Kataoka, Jun Uzuhashi, Kenta Chokawa, Hideki Sakurai, Akira Uedono, Tetsuo Narita, Kacper Sierakowski, Michal Bockowski, Ritsuo Otsuki, Koki Kobayashi, Yuta Itoh, Masahiro Nagao, Tadakatsu Ohkubo, Kazuhiro Hono, Jun Suda, Tetsu Kachi, and Nobuyuki Ikarashi
Journal:: JOURNAL OF APPLIED PHYSICS
Date Uploaded:: 28/09/2023
Date Modified:: 28/09/2023

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