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PHYSICAL REVIEW B
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SX-ARPES
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Near-interface electronic and magnetic states of insulator/Co2MnSi structures probed by hard x-ray photoemission combined with x-ray total reflection
Description/Abstract:
Depth-dependent electronic and magnetic states of AlOx and MgO capped Co2MnSi thin films were measured by using hard X-ray photoemission ...
Keyword:
HAXPES
,
SX-ARPES
,
X-ray total reflection
,
insulator/Co2MnSi heterostructures
, and
interface and bulk electronic and magnetic states
Resource Type:
Article
Author:
Shigenori Ueda
,
Yuichi Fujita
, and
Yuya Sakuraba
Journal:
PHYSICAL REVIEW B
Date Uploaded:
13/02/2024
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Keyword
HAXPES
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SX-ARPES
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X-ray total reflection
1
insulator/Co2MnSi heterostructures
1
interface and bulk electronic and magnetic states
1
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English
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APS
1
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Article
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open
1
Rights Statement Sim
Creative Commons BY Attribution 4.0 International
1
Author
Shigenori Ueda
1
Yuichi Fujita
1
Yuya Sakuraba
1
Journal
PHYSICAL REVIEW B
[remove]
1