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Filtering by: Author Jun Uzuhashi Keyword transmission electron microscopy Publisher American Chemical Society (ACS)

Atomic Diffusion of Indium through Threading Dislocations in InGaN Quantum Wells

Description/Abstract:

The compositional and structural investigations of threading dislocations (TDs) in InGaN/GaN multiple quantum wells were carried out usin...

Keyword:

InGaN, atom probe tomography, dislocation, pipe diffusion, and transmission electron microscopy

Resource Type:

Article

Author:

Yudai Yamaguchi, Yuya Kanitani, Yoshihiro Kudo, Jun Uzuhashi, Tadakatsu Ohkubo, Kazuhiro Hono, and Shigetaka Tomiya

Journal:

NANO LETTERS

Date Uploaded:

04/10/2023

Date Modified:

04/10/2023