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Tuning Interfacial Thermal and Electrical Conductance across a Metal/MoS2 Monolayer through N‐Methyl‐2‐pyrrolidone Wet Cleaning
Description/Abstract:
Extensive effort has been dedicated to developing two-dimensional (2D) materials as an alternative to Si-based semiconductor technology. ...
Keyword:
electrical conductance, interfacial thermal resistances, molybdenum disulfide, monolayers, wet cleaning
Resource Type:
Article
Author:
Yen‐Ju Wu
,
Yann‐Wen Lan
,
Shih‐Chieh Hsu
,
Chen‐Hao Yeh
,
Yu‐Seng Ku
,
Jyh‐Chiang Jiang
, and
Yibin Xu
Date Uploaded:
22/03/2023
Calculations of electron inelastic mean free paths. IX. Data for 41 elemental solids over the 50 eV to 30 keV range
Description/Abstract:
We have calculated inelastic mean free paths (IMFPs) for 41 elemental solids (Li, Be, graphite, diamond, glassy C, Na, Mg, Al, Si, K,Sc,T...
Keyword:
electron inelastic mean free paths
,
IMFP
,
elemental solids
, and
TPP-2M
Material/Specimen:
elemental solids
Resource Type:
Article
Author:
Tanuma, Shigeo
,
Powell, C. J.
, and
Penn, D. R.
Journal:
SURFACE AND INTERFACE ANALYSIS
Date Uploaded:
01/11/2021
Date Modified:
16/12/2021
Calculation of Electron Inelastic Mean Free Paths (IMFPs). VII. Reliability of the TPP-2M IMFP Predictive Equation
Description/Abstract:
We report comparisons of electron inelastic mean free paths (IMFPs) determined from our predictive IMFP equation TPP-2M and reference IMF...
Keyword:
electron inelastic mean free paths
,
IMFP
,
IMFPs
,
TPP-2M
,
number of valence electrons
,
elemental solids
, and
surface sensitivity
Resource Type:
Article
Author:
Tanuma, Shigeo
,
Powell, C. J.
, and
Penn, D. R.
Journal:
SURFACE AND INTERFACE ANALYSIS
Date Uploaded:
01/11/2021
Date Modified:
04/01/2022
Experimental Determination of Electron Inelastic Mean Free Paths in 13 Elemental Solids in the 50 eV to 5000 eV Energy Range by Elastic-Peak Electron Spectroscopy
Description/Abstract:
We have determined electron inelastic mean free paths (IMFPs) in C (graphite), Si, Cr, Fe, Cu, Zn, Ga, Mo, Ag, Ta, W, Pt and Au by elasti...
Keyword:
electron inelastic mean free paths
,
experimental determination
,
elastic- peak electron spectroscopy
, and
Monte Carlo simulation
Material/Specimen:
C (graphite), Si, Cr, Fe, Cu, Zn, Ga, Mo, Ag, Ta, W, Pt and Au
Resource Type:
Article
Author:
Tanuma, Shigeo
,
Shiratori, T
,
Kimura, Takashi
,
Goto, Keisuke
,
Ichimura, Shingo
, and
Powell, Cedric J
Journal:
SURFACE AND INTERFACE ANALYSIS
Date Uploaded:
04/10/2021
Date Modified:
18/10/2021
Calculations of electron inelastic mean free paths. X. Data for 41 elemental solids over the 50 eV to 200 keV range with the relativistic full Penn algorithm
Description/Abstract:
<h4>Abstract</h4> We have calculated inelastic mean free paths (IMFPs) for 41 elemental solids (Li, Be, graphite, diamond, glassy C, Na,...
Keyword:
electron inelastic mean free path
,
inelastic mean free paths
,
predictive equation for IMFP
,
elemental solid
,
relativistic Bethe equation
,
Fano plot
,
IMFP
,
ELF
,
energy loss function
,
optical constant
,
relativistic full Penn algorithm
,
full Penn algorithm
,
FPA
,
TPP-2M
, and
relativistic TPP-2M
Material/Specimen:
41 elemental solids (Li, Be, graphite, diamond, glassy C, Na, Mg, Al, Si, K, Sc, Ti, V, Cr, Fe, Co, Ni, Cu, Ge, Y, Nb, Mo, Ru, Rh, Pd, Ag, In, Sn, Cs, Gd, Tb, Dy, Hf, Ta, W, Re, Os, Ir, Pt, Au, and Bi)
Resource Type:
Article
Author:
Shinotsuka, Hiroshi
,
TANUMA, Shigeo
,
Powell, Cedric J.
, and
Penn, David R.
Journal:
Surface and Interface Analysis
Date Uploaded:
01/04/2021
Date Modified:
19/07/2021
Summary of ISO/TC 201 Standard: XX ISO 18118: 2004 — Surface chemical analysis — Auger electron spectroscopy and X-ray photoelectron spectroscopy —Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials
Description/Abstract:
ISO 18118 provides guidance on the measurement and use of experimentally determined relative sensitivity factors for the quantitative ana...
Keyword:
AES
,
Auger electron spectroscopy
,
ISO
,
International Organization for Standardization
,
X-ray photoelectron spectroscopy
,
XPS
,
quantitative surface analysis
, and
relative sensitivity factor
Resource Type:
Article
Author:
TANUMA, Shigeo
Journal:
Surface and Interface Analysis
Date Uploaded:
08/10/2020
Date Modified:
01/07/2021
Calculations of Electron Inelastic Mean Free Paths. XI. Data for Liquid Water for Energies from 50 eV to 30 keV
Description/Abstract:
We calculated electron inelastic mean free paths (IMFPs) for liquid water from its optical energy-loss function (ELF) for electron energi...
Keyword:
EAL
,
Electron Inelastic Mean Free Path
,
IMFP
,
effective attenuation length
,
liquid water
,
relativistic TPP-2M
,
relativistic full Penn algorithm
, and
static structure factor
Resource Type:
Article
Author:
Shinotsuka, Hiroshi
,
Da, Bo
,
Tanuma, Shigeo
,
Yoshikawa, Hideki
,
Powell , Cedric J
, and
Penn, David R
Journal:
Surface and Interface Analysis
Date Uploaded:
31/07/2020
Date Modified:
02/07/2021
Calculations of electron inelastic mean free paths. XII. Data for 42 inorganic compounds over the 50 eV to 200 keV range with the full Penn algorithm
Description/Abstract:
We have calculated inelastic mean free paths (IMFPs) for 42 inorganic compounds (AgBr, AgCl, AgI, Al2O3, AlAs, AlN, AlSb, cubic BN, hexa...
Keyword:
Electron Inelastic Mean Free Path
,
IMFP
, and
TPP-2M
Resource Type:
Article
Author:
Shinotsuka, Hiroshi
,
Tanuma, Shigeo
,
Powell, Cedric J.
, and
Penn, Dave R.
Journal:
Surface and Interface Analysis
Date Uploaded:
26/06/2020
Date Modified:
08/07/2021
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electron inelastic mean free path
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38
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Creative Commons BY Attribution 4.0 International
17
Creative Commons BY-NC Attribution-NonCommercial 4.0 International
8
In Copyright
8
Creative Commons BY-NC-ND Attribution-NonCommercial-NoDerivs 4.0 International
5
Material/Specimen
41 elemental solids (Li, Be, graphite, diamond, glassy C, Na, Mg, Al, Si, K, Sc, Ti, V, Cr, Fe, Co, Ni, Cu, Ge, Y, Nb, Mo, Ru, Rh, Pd, Ag, In, Sn, Cs, Gd, Tb, Dy, Hf, Ta, W, Re, Os, Ir, Pt, Au, and Bi)
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C (graphite), Si, Cr, Fe, Cu, Zn, Ga, Mo, Ag, Ta, W, Pt and Au
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elemental solids
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Date accepted
2002
1
2015
1
Author
Tanuma, Shigeo
6
Shigeki Kawai
4
Katsuhiko Ariga
3
Kewei Sun
3
Penn, D. R.
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https://creativecommons.org/licenses/by-nc-nd/4.0/
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Japan Society for the Promotion of Science
6
Engineering and Physical Sciences Research Council
2
JSPS
2
JST
2
Academy of Finland
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Journal
Surface and Interface Analysis
7
SURFACE AND INTERFACE ANALYSIS
4
Advanced Materials Interfaces
3
Angewandte Chemie International Edition
3
ADVANCED MATERIALS
2
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