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TANUMA, Shigeo
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Wiley
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Calculations of electron inelastic mean free paths.VIII. Data for 15 elemental solids over the 50-2000 eV range
Description/Abstract:
We report calculations of electron inelastic mean free paths (IMFPs) for 50 eV to 2000 eV electrons in 14 elemental solids (Li, Be, diamo...
Keyword:
IMFP
,
Li, Be, diamond, graphite, Na, K, Sc, Ge, In, Sn, Cs, Gd, Tb, Dy, Al
,
TPP-2M equation
,
electron inelastic mean free path
, and
rare-earth elements
Resource Type:
Article
Author:
TANUMA, Shigeo
,
C.J. Powell
, and
D.R. Penn
Journal:
SURFACE AND INTERFACE ANALYSIS
Date Uploaded:
29/05/2023
Date Modified:
30/05/2023
Summary of ISO/TC 201 Standard: XX ISO 18118: 2004 — Surface chemical analysis — Auger electron spectroscopy and X-ray photoelectron spectroscopy —Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials
Description/Abstract:
ISO 18118 provides guidance on the measurement and use of experimentally determined relative sensitivity factors for the quantitative ana...
Keyword:
AES
,
Auger electron spectroscopy
,
ISO
,
International Organization for Standardization
,
X-ray photoelectron spectroscopy
,
XPS
,
quantitative surface analysis
, and
relative sensitivity factor
Resource Type:
Article
Author:
TANUMA, Shigeo
Journal:
Surface and Interface Analysis
Date Uploaded:
08/10/2020
Date Modified:
01/07/2021
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Creative Commons BY-NC Attribution-NonCommercial 4.0 International
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TANUMA, Shigeo
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2
C.J. Powell
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D.R. Penn
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SURFACE AND INTERFACE ANALYSIS
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Surface and Interface Analysis
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