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Filtering by: Instrument manufacturer Ritsumeikan SR Center Keyword Pure metal

XAFS spectrum of Silicon (powder)

Description/Abstract:

This dataset consists of X-ray absorption fine structure (XAFS) spectra at Si K-edge of Silicon (powder) measured at Ritsumeikan-SR BL-10...

Keyword:

BL-10, Pure metal, Ritsumeikan-SR, Si, Si K-edge, Silicon (powder), XAFS, and collection - MDR XAFS DB

Resource Type:

Dataset

Data origin:

experiments

Date Uploaded:

08/06/2022
XAFS spectrum of Silicon (wafer)

Description/Abstract:

This dataset consists of X-ray absorption fine structure (XAFS) spectra at Si K-edge of Silicon (wafer) measured at Ritsumeikan-SR BL-10,...

Keyword:

BL-10, Pure metal, Ritsumeikan-SR, Si, Si K-edge, Silicon (wafer), XAFS, and collection - MDR XAFS DB

Resource Type:

Dataset

Data origin:

experiments

Date Uploaded:

08/06/2022
XAFS spectrum of Aluminum

Description/Abstract:

This dataset consists of X-ray absorption fine structure (XAFS) spectra at Al K-edge of Aluminum measured at Ritsumeikan-SR BL-10, and is...

Keyword:

Al, Al K-edge, Aluminum, BL-10, Pure metal, Ritsumeikan-SR, XAFS, and collection - MDR XAFS DB

Resource Type:

Dataset

Data origin:

experiments

Date Uploaded:

08/06/2022