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Filtering by: Journal PHYSICAL REVIEW B Keyword SX-ARPES Keyword X-ray total reflection

Near-interface electronic and magnetic states of insulator/Co2MnSi structures probed by hard x-ray photoemission combined with x-ray total reflection

Description/Abstract:

Depth-dependent electronic and magnetic states of AlOx and MgO capped Co2MnSi thin films were measured by using hard X-ray photoemission ...

Keyword:

HAXPES, SX-ARPES, X-ray total reflection, insulator/Co2MnSi heterostructures, and interface and bulk electronic and magnetic states

Resource Type:

Article

Author:

Shigenori Ueda, Yuichi Fujita, and Yuya Sakuraba

Journal:

PHYSICAL REVIEW B

Date Uploaded:

13/02/2024