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田沼 繁夫
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Auger electron spectroscopy
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オージェ電子分光法における背面散乱補正 I.広い分析条件で使用可能な電子の背面散乱補正式の開発
Description/Abstract:
AESによる表面定量分析において重要な電子の背面散乱について検討した.電子の背面散乱係数の入射角度依存性,およびそのエネルギーの平均値および中央値について,モンテカルロ(MC)法を用いてBe, B, C, Al, Si, Cu, Zr, Ag, La, Auの10種類の元素...
Keyword:
AES
,
Auger electron spectroscopy
,
electron backscattering correction
, and
predictive formula for back scattering correction
Resource Type:
Article
Author:
田沼 繁夫
Journal:
JOURNAL OF SURFACE ANALYSIS
Date Uploaded:
29/06/2023
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Keyword
AES
1
Auger electron spectroscopy
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electron backscattering correction
1
predictive formula for back scattering correction
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Japanese
1
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一般社団法人 表面分析研究会
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Article
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open
1
Rights Statement Sim
Creative Commons BY-NC Attribution-NonCommercial 4.0 International
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Author
田沼 繁夫
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1
Journal
JOURNAL OF SURFACE ANALYSIS
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