Skip to Content
Toggle navigation
Home
About
Help
Contact
Login
Search MDR
Go
Search Constraints
Start Over
Filtering by:
Author
TANUMA, Shigeo
Remove constraint Author: TANUMA, Shigeo
Language
English
Remove constraint Language: English
Resource type
Article
Remove constraint Resource type: Article
1
-
3
of
3
Sort by relevance
relevance
date uploaded ▼
date uploaded ▲
date modified ▼
date modified ▲
Number of results to display per page
10 per page
10
per page
20
per page
50
per page
100
per page
View results as:
List
Gallery
Masonry
Slideshow
Search Results
1.
Calculations of electron inelastic mean free paths.VIII. Data for 15 elemental solids over the 50-2000 eV range
Description/Abstract:
We report calculations of electron inelastic mean free paths (IMFPs) for 50 eV to 2000 eV electrons in 14 elemental solids (Li, Be, diamo...
Keyword:
IMFP
,
Li, Be, diamond, graphite, Na, K, Sc, Ge, In, Sn, Cs, Gd, Tb, Dy, Al
,
TPP-2M equation
,
electron inelastic mean free path
, and
rare-earth elements
Resource Type:
Article
Author:
TANUMA, Shigeo
,
C.J. Powell
, and
D.R. Penn
Journal:
SURFACE AND INTERFACE ANALYSIS
Date Uploaded:
29/05/2023
Date Modified:
30/05/2023
2.
Energy Dependence of Electron Stopping Powers in Elemental Solids over the 100 eV to 30 keV Energy Range
Description/Abstract:
We analyzed the energy dependence of electron stopping powers (SPs) calculated for 41 elemental solids from experimental optical data for...
Keyword:
Electron stopping power
,
Elemental solids
,
Energy dependence
, and
Fano plo
Resource Type:
Article
Author:
KUMAGAI, kazuhiro
,
TANUMA, Shigeo
, and
C.J. Powell
Journal:
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS
Date Uploaded:
29/05/2023
3.
Summary of ISO/TC 201 Standard: XX ISO 18118: 2004 — Surface chemical analysis — Auger electron spectroscopy and X-ray photoelectron spectroscopy —Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials
Description/Abstract:
ISO 18118 provides guidance on the measurement and use of experimentally determined relative sensitivity factors for the quantitative ana...
Keyword:
AES
,
Auger electron spectroscopy
,
ISO
,
International Organization for Standardization
,
X-ray photoelectron spectroscopy
,
XPS
,
quantitative surface analysis
, and
relative sensitivity factor
Resource Type:
Article
Author:
TANUMA, Shigeo
Journal:
Surface and Interface Analysis
Date Uploaded:
08/10/2020
Date Modified:
01/07/2021
Toggle facets
Limit your search
Type of work
Publication
3
Keyword
AES
1
Auger electron spectroscopy
1
Electron stopping power
1
Elemental solids
1
Energy dependence
1
more
Keywords
»
Language
English
[remove]
3
Publisher
Wiley
2
Elsevier
1
Resource type
Article
[remove]
3
Visibility
open
3
Rights Statement Sim
Creative Commons BY-NC Attribution-NonCommercial 4.0 International
1
Creative Commons BY-NC-ND Attribution-NonCommercial-NoDerivs 4.0 International
1
In Copyright
1
Author
TANUMA, Shigeo
[remove]
3
C.J. Powell
2
D.R. Penn
1
KUMAGAI, kazuhiro
1
License
http://rightsstatements.org/vocab/InC/1.0/
1
Journal
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS
1
SURFACE AND INTERFACE ANALYSIS
1
Surface and Interface Analysis
1