Skip to Content
Toggle navigation
Home
About
Help
Contact
Login
Search MDR
Go
Search Constraints
Start Over
Filtering by:
Characterization methods
spectroscopy
Remove constraint Characterization methods: spectroscopy
1
-
8
of
8
Sort by relevance
relevance
date uploaded ▼
date uploaded ▲
date modified ▼
date modified ▲
Number of results to display per page
10 per page
10
per page
20
per page
50
per page
100
per page
View results as:
List
Gallery
Masonry
Slideshow
Search Results
Raw data files for Fig. 12 Auger depth profiles in "Auger Depth Profiling Analysi...
Raw data files for Fig. 11 Auger depth profiles in "Auger Depth Profiling Analysi...
Raw data files for Fig. 10 Auger depth profiles in "Auger Depth Profiling Analysi...
Raw data files for Fig. 9 Auger depth profiles in "Auger Depth Profiling Analysis...
Raw data files for Fig. 5 Auger depth profiles in "Auger Depth Profiling Analysis...
Raw data files for Fig. 6 Auger depth profiles in "Auger Depth Profiling Analysis...
Raw data files for Fig. 7 Auger depth profiles in "Auger Depth Profiling Analysis...
Raw data files for Fig. 8 Auger depth profiles in "Auger Depth Profiling Analysis...
Toggle facets
Limit your search
Type of work
Dataset
8
Keyword
Auger depth profiling analysis
8
HfO2/Si
8
Ultra low angle incidence ion beam
8
Publisher
National Institute for Materials Science
7
Resource type
Dataset
8
Visibility
open
8
Rights Statement Sim
In Copyright
8
Data origin
experiments
7
experiment
1
Characterization methods
spectroscopy
[remove]
8
Author
NAGATA, Takahiro
8
OGIWARA, Toshiya
8
YOSHIKAWA, Hideki
8