4 件のレコードが見つかりました。

MMPaper2025(M.Takeguchi).pdf
Development of a Double-tilt Liquid Cell Holder for Zone-axis Incidence Imaging of FIB-prepared Single Crystal Samples
プレゼンテーション
著者
Masaki Takeguchi (author) (この著者で検索)
National Institute for Materials Science Research Center for Energy and Environmental Materials (GREEN)/Battery and Cell Materials Field/Environment-Controlled Microscopy Group
ORCID SAMURAI ;
Jonathan Lueke (author) (この著者で検索)
Norcada (Canada)
;
Baibing Zhao (author) (この著者で検索)
KITANO SEIKI Ltd
;
Ayako Hashimoto (author) (この著者で検索)
National Institute for Materials Science Research Center for Energy and Environmental Materials (GREEN)/Battery and Cell Materials Field/Environment-Controlled Microscopy Group
ORCID SAMURAI
キーワード
Double-tilt Liquid Cell Holder, FIB-prepared Single Crystal Sample
刊行年月日
2025-07-25
更新時刻
2025-09-12 11:41:26 +0900
P01-Single-Atom Sn-Loaded Exfoliated Layered Titanate Shows Photocatalytic Activity in Hydrogen Generation.docx
Single-Atom Sn-Loaded Exfoliated Layered Titanate Shows Photocatalytic Activity in Hydrogen Generation
ジャーナル論文
著者
Tuğçe Üstünel (author) (この著者で検索)
; ORCID SAMURAI ;
Sarp Kaya (author) (この著者で検索)
;
Hiroaki Matsumoto (author) (この著者で検索)
;
Keisuke Igarashi (author) (この著者で検索)
;
Esmail Doustkhah (author) (この著者で検索)
キーワード
layered titanate, HAADF-STEM, single atom
刊行年月日
2023-07-22
更新時刻
2024-12-05 16:30:42 +0900
21-Wen-MicroscopyandMicrosnalysis-27-2974(Proceeding).pdf
Quantitative analysis of 3D structures in metal-oxide composites
ジャーナル論文
著者
Yu Wen (author) (この著者で検索)
;
Ayako Hashimoto (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
Akihiko Hirata (author) (この著者で検索)
;
Hideki Abe (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI
キーワード
Betti number, Metal-oxide nanocomposite, STEM tomography, Ionic conductivity
刊行年月日
2021-07-30
更新時刻
2024-12-18 16:31:18 +0900
An Automated Site-Specific Tip Preparation Method for Atom Probe Tomography Using Script-Controlled Focused Ion Beam-Scanning Electron Microscopy.pdf
An Automated Site-Specific Tip Preparation Method for Atom Probe Tomography Using Script-Controlled Focused Ion Beam/Scanning Electron Microscopy
ジャーナル論文
著者
ORCID SAMURAI ; ORCID SAMURAI ; ORCID SAMURAI
キーワード
atom probe tomography, focused ion beam, scanning electron microscopy
刊行年月日
2025-02-03
更新時刻
2024-09-05 08:30:18 +0900
絞り込み