XPS spectral data for p- and n-type Si wafers with various resistivities acquired at SPring-8 BL15
- データセット
- 著者
-
SUMIYA, Masatomo (author) (この著者で検索)National Institute for Materials Science
- キーワード
- XPS, SPring-8 BL15, Si
- 刊行年月日
- 更新時刻
- 2024-05-24 08:30:24 +0900
Calculation of Electron Inelastic Mean Free Paths (IMFPs). VII. Reliability of the TPP-2M IMFP Predictive Equation
- ジャーナル論文
- 著者
-
Tanuma, Shigeo (author) (この著者で検索)
;
Powell, C. J. (author) (この著者で検索)
https://orcid.org/0000-0001-8990-2286
(unauthenticated)
;
Penn, D. R. (author) (この著者で検索) - キーワード
- IMFP, TPP-2M, number of valence electrons, elemental solids, XPS, electron inelastic mean free paths, surface sensitivity, IMFPs, AES, surface analysis
- 刊行年月日
- 2003-02-11
- 更新時刻
- 2022-10-03 01:54:38 +0900