4 件のレコードが見つかりました。
Polarization-dependent Bulk-sensitive Valence Band Photoemission Spectroscopy and Density Functional Theory Calculations: Part IV. 4f Rare-earths
- ジャーナル論文
- 著者
-
Shigenori Ueda (author) (この著者で検索)National Institute for Materials Science
;
Ikutaro Hamada (author) (この著者で検索) - キーワード
- HAXPES, 4f rare-earths, valence band, core level, X-ray polarization
- 刊行年月日
- 2025-07-15
- 更新時刻
- 2025-06-27 12:30:24 +0900
Near-interface electronic and magnetic states of insulator/Co2MnSi structures probed by hard x-ray photoemission combined with x-ray total reflection
- ジャーナル論文
- 著者
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Shigenori Ueda (author) (この著者で検索)National Institute for Materials Science Research Center for Electronic and Optical Materials/Functional Materials Field/Electro-ceramics Group
;
Yuichi Fujita (author) (この著者で検索)National Institute for Materials Science Global Networking Division/International Center for Young Scientists
;
Yuya Sakuraba (author) (この著者で検索)National Institute for Materials Science Research Center for Magnetic and Spintronic Materials/Magnetic Functional Device Group
- キーワード
- insulator/Co2MnSi heterostructures, interface and bulk electronic and magnetic states, HAXPES, X-ray total reflection, SX-ARPES
- 刊行年月日
- 2024-02-07
- 更新時刻
- 2024-02-13 09:11:36 +0900
Effects of nitrosyl fluoride based gas treatment on fluorination and redox reaction at GaN surface and Pt/GaN interface
- ジャーナル論文
- 著者
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Takahiro Nagata (author) (この著者で検索)
;
Asahiko Matsuda (author) (この著者で検索)
;
Takashi Teramoto (author) (この著者で検索)
https://orcid.org/0000-0002-9368-1284
(unauthenticated)
;
Dominic Gerlach (author) (この著者で検索)
https://orcid.org/0000-0003-1859-0750
(unauthenticated)
;
Peng Shen (author) (この著者で検索)
https://orcid.org/0000-0002-1971-5490
(unauthenticated)
;
Shigenori Ueda (author) (この著者で検索)
;
Takako Kimura (author) (この著者で検索)
https://orcid.org/0009-0007-0109-4482
(unauthenticated)
;
Christian Dussarrat (author) (この著者で検索)
https://orcid.org/0009-0000-1063-6473
(unauthenticated)
;
Toyohiro Chikyow (author) (この著者で検索)
- キーワード
- gallium nitride, GaN, nitrosyl fluoride, FNO, HAXPES, defect passivation, fluorination
- 刊行年月日
- 2025-03-07
- 更新時刻
- 2025-03-26 17:26:31 +0900
Electron trapping/detrapping at oxygen vacancies and imprint evolution in La-doped Hf0.5Zr0.5O2 ferroelectric capacitors probed by hard x-ray photoelectron spectroscopy
- ジャーナル論文
- 著者
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W. Hamouda (author) (この著者で検索)
https://orcid.org/0000-0002-7055-7264
(unauthenticated)
;
Y. Yamashita (author) (この著者で検索)
;
S. Ueda (author) (この著者で検索)
;
S. Matzen (author) (この著者で検索)
https://orcid.org/0000-0002-4244-6516
(unauthenticated)
;
O. Renault (author) (この著者で検索)
https://orcid.org/0000-0002-0683-9590
(unauthenticated)
;
F. Mehmood (author) (この著者で検索)
https://orcid.org/0000-0002-9530-380X
(unauthenticated)
;
T. Mikolajick (author) (この著者で検索)
https://orcid.org/0000-0003-3814-0378
(unauthenticated)
;
U. Schroeder (author) (この著者で検索)
https://orcid.org/0000-0002-6824-2386
(unauthenticated)
;
N. Barrett (author) (この著者で検索)
https://orcid.org/0000-0002-8228-0805
(unauthenticated)
- キーワード
- Hf0.5Zr0.5O2, HAXPES, operando
- 刊行年月日
- 2025-11-03
- 更新時刻
- 2025-11-13 12:30:12 +0900