Article Near-interface electronic and magnetic states of insulator/Co2MnSi structures probed by hard x-ray photoemission combined with x-ray total reflection

Shigenori Ueda SAMURAI ORCID (Research Center for Electronic and Optical Materials/Functional Materials Field/Electro-ceramics Group, National Institute for Materials ScienceROR) ; Yuichi Fujita ORCID (Global Networking Division/International Center for Young Scientists, National Institute for Materials ScienceROR) ; Yuya Sakuraba SAMURAI ORCID (Research Center for Magnetic and Spintronic Materials/Magnetic Functional Device Group, National Institute for Materials ScienceROR)

Ueda_PRB2024.pdf
Download file (1.47 MB)
Download as zip (1.31 MB)
Collection

Citation
Shigenori Ueda, Yuichi Fujita, Yuya Sakuraba. Near-interface electronic and magnetic states of insulator/Co2MnSi structures probed by hard x-ray photoemission combined with x-ray total reflection. PHYSICAL REVIEW B. 2024, 109 (8), 085109.
SAMURAI

Description:

(abstract)

Depth-dependent electronic and magnetic states of AlOx and MgO capped Co2MnSi thin films were measured by using hard X-ray photoemission spectroscopy (HAXPES) combined with X-ray total reflection (TR). TR-HAXPES revealed that the near-interface electronic and magnetic states of Co2MnSi films differed from those of bulk measured in non-TR condition. The decrease of the Co and Mn magnetizations near the interface along the easy magnetization axis in the bulk region relative to those in the bulk region and the changes in the valence band profiles were experimentally detected by non-destructive HAXPES utilizing TR. These results suggest that the combination of HAXPES with TR is useful to experimentally detect the electronic and magnetic states of near-interface and buried bulk regions in non-destructive way for insulator/ferromagnet heterojunctions.

Rights:

  • Creative Commons BY Attribution 4.0 International Creative Commons BY Attribution 4.0 International
    Published by the American Physical Society under the terms of the Creative Commons Attribution 4.0 International license. Further distribution of this work must maintain attribution to the author(s) and the published article’s title, journal citation, and DOI.

Keyword: insulator/Co2MnSi heterostructures, interface and bulk electronic and magnetic states, HAXPES, X-ray total reflection, SX-ARPES

Date published: 2024-02-07

Publisher: APS

Journal:

  • PHYSICAL REVIEW B (ISSN: 24699969) vol. 109 issue. 8 085109

Funding:

Manuscript type: Publisher's version (Version of record)

MDR DOI:

First published URL: https://doi.org/10.1103/PhysRevB.109.085109

Related item:

Other identifier(s):

Contact agent:

Updated at: 2024-02-13 09:11:36 +0900

Published on MDR: 2024-02-13 12:30:14 +0900

Filename Size
Filename Ueda_PRB2024.pdf (Thumbnail)
application/pdf 		Size 1.47 MB Detail