Reliability Challenges in Equivalent-Oxide-Thickness Scaling with High-κ Er2O3 Dielectrics on Two-Dimensional MoS2 Field-Effect Transistors
- ジャーナル論文
- 著者
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;Shuhong Li (author) (この著者で検索);Ryotaro Otake (author) (この著者で検索);Tomonori Nishimura (author) (この著者で検索)Takashi Taniguchi (author) (この著者で検索)National Institute for Materials Science
;
Kenji Watanabe (author) (この著者で検索)National Institute for Materials Science
;
Yoshiki Sakuma (author) (この著者で検索)National Institute for Materials Science
;
Kosuke Nagashio (author) (この著者で検索) - キーワード
- High-κ dielectric, MoS2, 2D semiconductor
- 刊行年月日
- 2025-05-05
- 更新時刻
- 2026-07-29 11:45:27 +0900
Optimizing thermal energy harvesting in few-layer MoS2 with measurements of electron's effective mass in two-dimensional semiconductors
- ジャーナル論文
- 著者
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Kuan-Cheng Lu (author) (この著者で検索)
https://orcid.org/0009-0003-5351-9949
(unauthenticated)
;
Chetan Awasthi (author) (この著者で検索)
https://orcid.org/0000-0002-6027-5095
(unauthenticated)
;
;Ta-Wei Chiu (author) (この著者で検索)S. S. Islam (author) (この著者で検索)
https://orcid.org/0000-0001-7696-5499
(unauthenticated)
;
Kimitoshi Kono (author) (この著者で検索)
https://orcid.org/0000-0002-4446-4419
(unauthenticated)
;
Kazuhito Tsukagoshi (author) (この著者で検索)
;
Wen-Bin Jian (author) (この著者で検索)
https://orcid.org/0000-0002-1898-9641
(unauthenticated)
- キーワード
- Two-Dimensional Semiconductors, Seebeck Coefficient, MoS2, Mott’s Hopping Transport
- 刊行年月日
- 2026-03-01
- 更新時刻
- 2026-01-14 10:42:17 +0900
Ion Migration in Monolayer Memristors
- ジャーナル論文
- 著者
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;Sotirios Papadopoulos (author) (この著者で検索);Tarun Agarwal (author) (この著者で検索);Achint Jain (author) (この著者で検索)Takashi Taniguchi (author) (この著者で検索)National Institute for Materials Science
;
Kenji Watanabe (author) (この著者で検索)National Institute for Materials Science
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;Mathieu Luisier (author) (この著者で検索);Alexandros Emboras (author) (この著者で検索)Lukas Novotny (author) (この著者で検索)
- キーワード
- Memristors, MoS2, defect densities
- 刊行年月日
- 2022-07-08
- 更新時刻
- 2025-03-01 12:30:23 +0900
Minigap-induced negative differential resistance in multilayer -based tunnel junctions
- ジャーナル論文
- 著者
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;Seiya Kawasaki (author) (この著者で検索)Kei Kinoshita (author) (この著者で検索)
https://orcid.org/0009-0005-4586-734X
(unauthenticated)
;
Rai Moriya (author) (この著者で検索)
https://orcid.org/0000-0001-7471-7432
(unauthenticated)
;
Momoko Onodera (author) (この著者で検索)
https://orcid.org/0000-0001-9457-6796
(unauthenticated)
;
Yijin Zhang (author) (この著者で検索)
https://orcid.org/0000-0003-1127-1124
(unauthenticated)
;
Kenji Watanabe (author) (この著者で検索)
;
Takashi Taniguchi (author) (この著者で検索)
;
Takao Sasagawa (author) (この著者で検索)
https://orcid.org/0000-0003-0149-6696
(unauthenticated)
;
Tomoki Machida (author) (この著者で検索)
https://orcid.org/0000-0002-1938-7415
(unauthenticated)
- キーワード
- Negative differential resistance, MoS2, tunnel junction
- 刊行年月日
- 2024-07-01
- 更新時刻
- 2025-02-06 12:30:24 +0900