キーワード: X-ray photoelectron spectroscopy
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5 件のレコードが見つかりました。

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Shinotsuka2024_ApplSurfSci685_162001.pdf
Bayesian estimation analysis of X-ray photoelectron spectra: Application to Si 2p spectrum analysis of oxidized silicon surfaces
ジャーナル論文
著者
Hiroshi Shinotsuka (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
Kenji Nagata (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
Hideki Yoshikawa (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
Shuichi Ogawa (author) (この著者で検索)
;
Akitaka Yoshigoe (author) (この著者で検索)
キーワード
Bayesian estimation, X-ray photoelectron spectroscopy, Statistical analysis, Silicon surface oxidation
刊行年月日
2024-12-03
更新時刻
2025-01-21 12:30:34 +0900
2024_Machida_JES_273_147499.pdf
Bayesian inference method utilizing SESSA in quantitative layer structure estimation from XPS data
ジャーナル論文
著者
Atsushi Machida (author) (この著者で検索)
;
Kenji Nagata (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
Ryo Murakami (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
Hiroshi Shinotsuka (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
Hayaru Shouno (author) (この著者で検索)
;
Hideki Yoshikawa (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
Masato Okada (author) (この著者で検索)
キーワード
X-ray photoelectron spectroscopy, Bayesian estimation, Exchange Monte Carlo method, SESSA
刊行年月日
2024-05-29
更新時刻
2025-11-10 12:30:27 +0900
Shinotsuka2023_JES267_147370.pdf
Sample structure prediction from measured XPS data using Bayesian estimation and SESSA simulator
ジャーナル論文
著者
Hiroshi Shinotsuka (author) (この著者で検索)
National Institute for Materials Science Research and Services Division of Materials Data and Integrated System
ORCID SAMURAI ;
Kenji Nagata (author) (この著者で検索)
National Institute for Materials Science Research and Services Division of Materials Data and Integrated System
ORCID SAMURAI ;
Malinda Siriwardana (author) (この著者で検索)
National Institute for Materials Science Research and Services Division of Materials Data and Integrated System
;
Hideki Yoshikawa (author) (この著者で検索)
National Institute for Materials Science Research and Services Division of Materials Data and Integrated System
ORCID SAMURAI ;
Hayaru Shouno (author) (この著者で検索)
The University of Electro-Communications Graduate School of Informatics and Engineering
ORCID ;
Masato Okada (author) (この著者で検索)
The University of Tokyo Graduate School of Frontier Science
ORCID
キーワード
X-ray photoelectron spectroscopy, Bayesian estimation, Exchange Monte Carlo method, SESSA
刊行年月日
2023-07-06
更新時刻
2024-01-05 22:11:57 +0900
Maximum a posteriori estimation for high-throughput peak fitting in X-ray photoelectron spectroscopy.pdf
Maximum a posteriori estimation for high-throughput peak fitting in X-ray photoelectron spectroscopy
ジャーナル論文
著者
Tarojiro Matsumura (author) (この著者で検索)
;
Naoka Nagamura (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
Shotaro Akaho (author) (この著者で検索)
;
Kenji Nagata (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
Yasunobu Ando (author) (この著者で検索)
キーワード
High-throughput analysis, Peak fitting, X-ray photoelectron spectroscopy, Maximum a posteriori estimation, Expectation– conditional maximisation algorithm
刊行年月日
2024-12-31
更新時刻
2024-12-10 16:30:32 +0900
Murakami_JES245_147003_2020_Preprint_20200210.pdf
Development of multiple core-level XPS spectra decomposition method based on the Bayesian information criterion
ジャーナル論文
著者
ORCID SAMURAI ; ORCID SAMURAI ;
Murakami, Ryo (author) (この著者で検索)
;
Tanaka, Hiromi (author) (この著者で検索)
;
Shouno, Hayaru (author) (この著者で検索)
; ORCID SAMURAI
キーワード
Automatic spectrum analysis, Bayesian information criterion, Multiple core level spectra, X-ray photoelectron spectroscopy
刊行年月日
2020-10-03
更新時刻
2024-01-05 22:13:27 +0900
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