Summary of ISO/TC 201 Standard: XX ISO 18118: 2004 — Surface chemical analysis — Auger electron spectroscopy and X-ray photoelectron spectroscopy —Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials

ジャーナル論文

著者

TANUMA, Shigeo (author) (この著者で検索)

https://orcid.org/0000-0003-2628-9941

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TANUMA, Shigeo

キーワード

XPS, quantitative surface analysis, X-ray photoelectron spectroscopy, Auger electron spectroscopy, relative sensitivity factor, ISO, International Organization for Standardization, AES

刊行年月日

2005-12-28

更新時刻

2024-01-05 22:11:34 +0900