3 件のレコードが見つかりました。 1件目から3件目まで表示します。
Vacancy-Type Defects and Oxygen Incorporation in NiAl for Advanced Interconnects Probed by Monoenergetic Positron Beams and Atom Probe Tomography
- ジャーナル論文
- 著者
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Akira Uedono (author) (この著者で検索)
https://orcid.org/0000-0001-6224-4869
(unauthenticated)
;
Claudia Fleischmann (author) (この著者で検索)
https://orcid.org/0000-0003-1531-6916
(unauthenticated)
;
;Jean-Philippe Soulié (author) (この著者で検索);Mustafa Ayyad (author) (この著者で検索)Jeroen E. Scheerder (author) (この著者で検索)
https://orcid.org/0000-0002-9301-0392
(unauthenticated)
;
;Christoph Adelmann (author) (この著者で検索)Jun Uzuhashi (author) (この著者で検索)
;
Tadakatsu Ohkubo (author) (この著者で検索)
;
Koji Michishio (author) (この著者で検索)
https://orcid.org/0000-0003-1381-7856
(unauthenticated)
;
;Nagayasu Oshima (author) (この著者で検索)Shoji Ishibashi (author) (この著者で検索)
https://orcid.org/0000-0002-4896-3530
(unauthenticated)
- キーワード
- atom probe tomography, positron annihilation
- 刊行年月日
- 2024-07-10
- 更新時刻
- 2025-07-10 08:30:19 +0900
Atomic resolution analysis of extended defects and Mg agglomeration in Mg-ion-implanted GaN and their impacts on acceptor formation
- ジャーナル論文
- 著者
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;Emi Kano (author) (この著者で検索);Keita Kataoka (author) (この著者で検索)Jun Uzuhashi (author) (この著者で検索)National Institute for Materials Science
;
;Kenta Chokawa (author) (この著者で検索);Hideki Sakurai (author) (この著者で検索);Akira Uedono (author) (この著者で検索);Tetsuo Narita (author) (この著者で検索);Kacper Sierakowski (author) (この著者で検索);Michal Bockowski (author) (この著者で検索);Ritsuo Otsuki (author) (この著者で検索);Koki Kobayashi (author) (この著者で検索);Yuta Itoh (author) (この著者で検索);Masahiro Nagao (author) (この著者で検索)Tadakatsu Ohkubo (author) (この著者で検索)National Institute for Materials Science
;
Kazuhiro Hono (author) (この著者で検索)National Institute for Materials Science
;
;Jun Suda (author) (この著者で検索);Tetsu Kachi (author) (この著者で検索)Nobuyuki Ikarashi (author) (この著者で検索)
- キーワード
- gallium nitride, transmission electron microscopy, atom probe tomography
- 刊行年月日
- 2022-08-14
- 更新時刻
- 2024-01-05 22:13:58 +0900
Development of automated tip preparation for atom probe tomography by using script-controlled FIB-SEM
- ジャーナル論文
- 著者
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Jun Uzuhashi (author) (この著者で検索)National Institute for Materials Science
;
Tadakatsu Ohkubo (author) (この著者で検索)National Institute for Materials Science
;
Kazuhiro Hono (author) (この著者で検索)National Institute for Materials Science
- キーワード
- atom probe tomography, focused ion beam, scanning electron microscopy, automation
- 刊行年月日
- 2023-02-19
- 更新時刻
- 2025-02-23 22:51:16 +0900