MDRについて
ヘルプ
お問い合わせ
Switch language
日本語
English
ログイン
ログイン
Search MDR
Home
論文・データセット
コレクション
資源タイプ
ジャーナル論文(3)
キーワード
gallium nitride (3)
FNO (1)
GaN (1)
HAXPES (1)
atom probe tomography (1)
defect passivation (1)
fluorination (1)
nitrosyl fluoride (1)
transmission electron microscopy (1)
(more)
ライセンス
Creative Commons BY Attribution 4.0 International (1)
Creative Commons BY-NC Attribution-NonCommercial 4.0 International (1)
In Copyright (1)
ファイル種別
application/pdf (3)
キーワード: gallium nitride
全ての絞り込みを解除
3 件のレコードが見つかりました。
Effects of nitrosyl fluoride based gas treatment on fluorination and redox reaction at GaN surface and Pt/GaN interface
ジャーナル論文
著者
Takahiro Nagata
(author) (
この著者で検索
)
https://orcid.org/0000-0002-8591-2943
NIMS Researchers Directory SAMURAI
Takahiro Nagata
;
Asahiko Matsuda
(author) (
この著者で検索
)
https://orcid.org/0000-0001-5989-027X
NIMS Researchers Directory SAMURAI
Asahiko Matsuda
;
Takashi Teramoto
(author) (
この著者で検索
)
https://orcid.org/0000-0002-9368-1284
(unauthenticated)
Takashi Teramoto
;
Dominic Gerlach
(author) (
この著者で検索
)
https://orcid.org/0000-0003-1859-0750
(unauthenticated)
Dominic Gerlach
;
Peng Shen
(author) (
この著者で検索
)
https://orcid.org/0000-0002-1971-5490
(unauthenticated)
Peng Shen
;
Shigenori Ueda
(author) (
この著者で検索
)
https://orcid.org/0000-0001-9425-0614
NIMS Researchers Directory SAMURAI
Shigenori Ueda
;
Takako Kimura
(author) (
この著者で検索
)
https://orcid.org/0009-0007-0109-4482
(unauthenticated)
Takako Kimura
;
Christian Dussarrat
(author) (
この著者で検索
)
https://orcid.org/0009-0000-1063-6473
(unauthenticated)
Christian Dussarrat
;
Toyohiro Chikyow
(author) (
この著者で検索
)
https://orcid.org/0000-0003-3860-4806
NIMS Researchers Directory SAMURAI
Toyohiro Chikyow
キーワード
gallium nitride
,
GaN
,
nitrosyl fluoride
,
FNO
,
HAXPES
,
defect passivation
,
fluorination
刊行年月日
2025-03-07
更新時刻
2025-03-26 17:26:31 +0900
Atomic resolution analysis of extended defects and Mg agglomeration in Mg-ion-implanted GaN and their impacts on acceptor formation
ジャーナル論文
著者
Emi Kano
(author) (
この著者で検索
)
Emi Kano
;
Keita Kataoka
(author) (
この著者で検索
)
Keita Kataoka
;
Jun Uzuhashi
(author) (
この著者で検索
)
https://orcid.org/0000-0003-2023-8158
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
Jun Uzuhashi
;
Kenta Chokawa
(author) (
この著者で検索
)
Kenta Chokawa
;
Hideki Sakurai
(author) (
この著者で検索
)
Hideki Sakurai
;
Akira Uedono
(author) (
この著者で検索
)
Akira Uedono
;
Tetsuo Narita
(author) (
この著者で検索
)
Tetsuo Narita
;
Kacper Sierakowski
(author) (
この著者で検索
)
Kacper Sierakowski
;
Michal Bockowski
(author) (
この著者で検索
)
Michal Bockowski
;
Ritsuo Otsuki
(author) (
この著者で検索
)
Ritsuo Otsuki
;
Koki Kobayashi
(author) (
この著者で検索
)
Koki Kobayashi
;
Yuta Itoh
(author) (
この著者で検索
)
Yuta Itoh
;
Masahiro Nagao
(author) (
この著者で検索
)
Masahiro Nagao
;
Tadakatsu Ohkubo
(author) (
この著者で検索
)
https://orcid.org/0000-0003-3548-1951
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
Tadakatsu Ohkubo
;
Kazuhiro Hono
(author) (
この著者で検索
)
https://orcid.org/0000-0001-7367-0193
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
Kazuhiro Hono
;
Jun Suda
(author) (
この著者で検索
)
Jun Suda
;
Tetsu Kachi
(author) (
この著者で検索
)
Tetsu Kachi
;
Nobuyuki Ikarashi
(author) (
この著者で検索
)
Nobuyuki Ikarashi
キーワード
gallium nitride
,
transmission electron microscopy
,
atom probe tomography
刊行年月日
2022-08-14
更新時刻
2024-01-05 22:13:58 +0900
Vacancy‐Type Defects and Their Trapping/Detrapping of Charge Carriers in Ion‐Implanted GaN Studied by Positron Annihilation
ジャーナル論文
著者
Akira Uedono
(author) (
この著者で検索
)
https://orcid.org/0000-0001-6224-4869
(unauthenticated)
Akira Uedono
;
Ryo Tanaka
(author) (
この著者で検索
)
https://orcid.org/0000-0002-4058-7649
(unauthenticated)
Ryo Tanaka
;
Shinya Takashima
(author) (
この著者で検索
)
https://orcid.org/0000-0002-3212-4521
(unauthenticated)
Shinya Takashima
;
Katsunori Ueno
(author) (
この著者で検索
)
Katsunori Ueno
;
Masaharu Edo
(author) (
この著者で検索
)
Masaharu Edo
;
Kohei Shima
(author) (
この著者で検索
)
https://orcid.org/0000-0003-0967-141X
(unauthenticated)
Kohei Shima
;
Shigefusa F. Chichibu
(author) (
この著者で検索
)
https://orcid.org/0000-0001-9558-1642
(unauthenticated)
Shigefusa F. Chichibu
;
Jun Uzuhashi
(author) (
この著者で検索
)
https://orcid.org/0000-0003-2023-8158
NIMS Researchers Directory SAMURAI
Jun Uzuhashi
;
Tadakatsu Ohkubo
(author) (
この著者で検索
)
https://orcid.org/0000-0003-3548-1951
NIMS Researchers Directory SAMURAI
Tadakatsu Ohkubo
;
Shoji Ishibashi
(author) (
この著者で検索
)
https://orcid.org/0000-0002-4896-3530
(unauthenticated)
Shoji Ishibashi
;
Kacper Sierakowski
(author) (
この著者で検索
)
https://orcid.org/0000-0002-9447-1182
(unauthenticated)
Kacper Sierakowski
;
Michal Bockowski
(author) (
この著者で検索
)
https://orcid.org/0000-0003-1616-685X
(unauthenticated)
Michal Bockowski
キーワード
gallium nitride
刊行年月日
2024-02-29
更新時刻
2025-03-01 12:30:45 +0900
キーワード
gallium nitride
(3)
FNO
(1)
GaN
(1)
HAXPES
(1)
atom probe tomography
(1)
defect passivation
(1)
fluorination
(1)
nitrosyl fluoride
(1)
transmission electron microscopy
(1)
RDEメタデータ定義
RDE送り状
<
1
>