3702 件のレコードが見つかりました。

PhysRevB.106.134438.pdf
Band-folding-driven high tunnel magnetoresistance ratios in (111)-oriented junctions with SrTiO 3 barriers
ジャーナル論文
著者
Keisuke Masuda (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
Hiroyoshi Itoh (author) (この著者で検索)
;
Yoshiaki Sonobe (author) (この著者で検索)
;
Hiroaki Sukegawa (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
Seiji Mitani (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
Yoshio Miura (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI
キーワード
Tunnel magnetoresistance, Magnetic tunnel junction, Spintronics
刊行年月日
2022-10-31
更新時刻
2024-04-11 13:28:22 +0900
Dataset
MaterialBERT for Natural Language Processing of Materials Science Texts
ジャーナル論文
著者
KAWANO, Hiroyuki (author) (この著者で検索)
Ridgelinez Limited
;
SATO, Fumitaka (author) (この著者で検索)
Ridgelinez Limited
;
YOSHITAKE, Michiko (author) (この著者で検索)
National Institute for Materials Science MaDIS
ORCID SAMURAI ;
MOTEKI, Fuma (operator) (この著者で検索)
Ridgelinez Limited
;
TERAOKA, Hiroshi (author) (この著者で検索)
Ridgelinez Limited
キーワード
word embedding, pre-training, BERT, literal information
刊行年月日
更新時刻
2025-04-15 08:30:11 +0900
Reproducible chiroptical activity from aggregated chiral thienopyrroledione fluorene conjugated polymers.pdf
Reproducible Chiroptical Activity from Aggregated Chiral Thienopyrroledione–Fluorene π‑Conjugated Polymers.
ジャーナル論文
著者
Nao Suzuki (author) (この著者で検索)
University of Tsukuba a Institute of Pure and Applied Sciences
;
Ziwei Hu (author) (この著者で検索)
;
Sota Nakayama (author) (この著者で検索)
;
Soh Kushida (author) (この著者で検索)
;
Yohei Yamamoto (author) (この著者で検索)
;
Wijak Yospanya (author) (この著者で検索)
;
Reiko Oda (author) (この著者で検索)
;
Takaki Kanbara (author) (この著者で検索)
;
Junpei Kuwabara (author) (この著者で検索)
キーワード
Chiral π‑conjugated polymer, thienopyrroledione, circular dichroism, circularly polarized luminescence
刊行年月日
2026-06-02
更新時刻
2026-06-19 13:05:19 +0900
Manuscript _final.pdf
Correlations between Li-Ion Concentration, Solvation Structure, and Equilibrium Potential of Li–Naphthalenide Solution for Li Alloying of Si Negative Electrode of Next-Generation Batteries
ジャーナル論文
著者
Fumisato Ozawa (author) (この著者で検索)
ORCID ;
Yusuke Himata (author) (この著者で検索)
;
Hikaru Enomoto (author) (この著者で検索)
;
Shota Azuma (author) (この著者で検索)
; ORCID SAMURAI ;
Morihiro Saito (author) (この著者で検索)
ORCID
キーワード
Si anode, Li predoping, prelithiation, Li-naphthalenide, radical anions, next-generation batteries
刊行年月日
2025-04-14
更新時刻
2025-04-15 09:58:25 +0900
article.pdf
Multidirectionally Controlled Arrangement via Ion‐Pairing Assembly of Amphiphilic Charged π‐Electronic Systems
ジャーナル論文
著者
Yuto Maruyama (author) (この著者で検索)
; ORCID SAMURAI ; ORCID SAMURAI ;
Hayato Kanai (author) (この著者で検索)
;
Yasuhiro Ishida (author) (この著者で検索)
;
Hiromitsu Maeda (author) (この著者で検索)
ORCID
キーワード
amphiphilic i𝜋– i𝜋 interactions, charged 𝜋-electronic systems, ion-pairing assemblies, lateral hydrophobic effects, multi-directional organization
刊行年月日
2025-11-25
更新時刻
2026-01-15 11:12:39 +0900
Vol.25_No.3_2019.pdf
English Translation of J. Surf. Anal. 24, 192-205(2018), Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam
ジャーナル論文
著者
ORCID SAMURAI ; ORCID SAMURAI ; ORCID SAMURAI
キーワード
Auger Depth Profiling Analysis, HfO2/Si, Ultra Low Angle Incidence Ion Beam
刊行年月日
2020-06-04
更新時刻
2022-10-03 01:48:14 +0900
HfO2-Fig12-Work-20230803.pdf
Raw data files for Fig. 12 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
データセット
著者
OGIWARA, Toshiya (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
NAGATA, Takahiro (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
YOSHIKAWA, Hideki (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI
キーワード
Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
刊行年月日
2019-03-07
更新時刻
2024-01-05 22:13:20 +0900
HfO2-Fig11-Work-20230710.pdf
Raw data files for Fig. 11 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
データセット
著者
OGIWARA, Toshiya (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
NAGATA, Takahiro (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
YOSHIKAWA, Hideki (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI
キーワード
Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
刊行年月日
2019-03-07
更新時刻
2024-04-07 22:57:41 +0900
HfO2-Fig10-Work-20230606.pdf
Raw data files for Fig. 10 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
データセット
著者
OGIWARA, Toshiya (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
NAGATA, Takahiro (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
YOSHIKAWA, Hideki (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI
キーワード
Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
刊行年月日
2019-03-07
更新時刻
2024-01-05 22:12:41 +0900
HfO2-Fig9-Work-20230518.pdf
Raw data files for Fig. 9 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
データセット
著者
OGIWARA, Toshiya (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
NAGATA, Takahiro (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
YOSHIKAWA, Hideki (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI
キーワード
Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
刊行年月日
2019-03-07
更新時刻
2024-10-08 12:20:27 +0900