Influence of Fermi level pinning on contact potential difference measurements using Kelvin probe force microscopy

論文

著者

Nobuyuki Ishida

キーワード

Kelvin probe force microscopy, Simulation, Electrostatic force, Fermi level pinning

刊行年月日

2025-03-07

更新時刻

2025-03-10 16:30:14 +0900