3 件のレコードが見つかりました。
Oxygen reduction for p-type TeOx thin-film transistor
- ジャーナル論文
- 著者
-
Seiichi Kato (author) (この著者で検索)
;
Masayuki Okamura (author) (この著者で検索)
https://orcid.org/0009-0003-3636-6653
(unauthenticated)
NIMS MANA
;
Tomomi Sawada (author) (この著者で検索)
https://orcid.org/0000-0002-2335-4480
(unauthenticated)
NIMS MANA
;
Toshihide Nabatame (author) (この著者で検索)
;
Kazuhito Tsukagoshi (author) (この著者で検索)
- キーワード
- oxide transistor, p-type TFT, TeOx, BEOL compatible, reducing agent, tungsten
- 刊行年月日
- 2026-05-25
- 更新時刻
- 2026-06-09 17:58:56 +0900
Influence of local structures on amorphous alumina exhibiting resistance random-access memory function
- ジャーナル論文
- 著者
-
;Masato Kubota (author) (この著者で検索)Seiichi Kato (author) (この著者で検索)National Institute for Materials Science
- キーワード
- ReRAM, aluminum oxide, oxygen vacancy
- 刊行年月日
- 2024-07-14
- 更新時刻
- 2024-08-20 12:30:28 +0900
Conduction band caused by oxygen vacancies in aluminum oxide for resistance random access memory
- ジャーナル論文
- 著者
-
;Kubota, Masato (author) (この著者で検索);Nigo, Seisuke (author) (この著者で検索)Kitazawa, Hideaki (author) (この著者で検索)
;
Harada, Yoshitomo (author) (この著者で検索)
;
;Kido, Giyuu (author) (この著者で検索);Hirayama, Taisei (author) (この著者で検索)Kato, Seiichi (author) (この著者で検索)
- キーワード
- Crystallographic defects, Random access memory, Electrical properties and parameters, First-principle calculations, electron energy loss spectroscopy, Electronic bandstructure, semiconductor structures, Resistive switching, Thermally stimulated current spectroscopy, Transmission electron microscope
- 刊行年月日
- 2012-08-01
- 更新時刻
- 2024-01-05 22:12:58 +0900