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ジャーナル論文(2)
キーワード
atomic force microscope (2)
Auger depth profiling analysis (1)
InP/GaInAsP multilayer specimens (1)
N-oxide, diblock copolymer (1)
cell spheroid (1)
depth resolution function (1)
protein adsorption (1)
sum frequency generation (1)
surface roughness (1)
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キーワード: atomic force microscope
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High-Quality Three-Dimensionally Cultured Cells Using Interfaces of Diblock Copolymers Containing Different Ratios of Zwitterionic N‑Oxides
ジャーナル論文
著者
Naoto Ogiwara
(author) (
この著者で検索
)
Department of Bioengineering, School of Engineering, The University of Tokyo
Naoto Ogiwara
;
Takenobu Nakano
(author) (
この著者で検索
)
Biotech Business Unit, Incubation Center, artience Co., Ltd.
Takenobu Nakano
;
Koki Baba
(author) (
この著者で検索
)
Biotech Business Unit, Incubation Center, artience Co., Ltd.
Koki Baba
;
Hidenori Noguchi
(author) (
この著者で検索
)
https://orcid.org/0000-0001-9643-1689
National Institute for Materials Science Research Center for Energy and Environmental Materials (GREEN)/Battery and Cell Materials Field/Interface Electrochemistry Group
NIMS Researchers Directory SAMURAI
Hidenori Noguchi
;
Tsukuru Masuda
(author) (
この著者で検索
)
Department of Bioengineering, School of Engineering, The University of Tokyo
Tsukuru Masuda
;
Madoka Takai
(author) (
この著者で検索
)
Department of Bioengineering, School of Engineering, The University of Tokyo
Madoka Takai
キーワード
cell spheroid
,
N-oxide, diblock copolymer
,
protein adsorption
,
atomic force microscope
,
sum frequency generation
刊行年月日
2024-08-28
更新時刻
2025-08-19 08:30:21 +0900
Depth Profiling Analysis of InP/GaInAsP Multilayers by Auger Electron Spectroscopy, Quantitative Evaluation of the Surface Roughness Caused by Ion Sputtering
ジャーナル論文
著者
OGIWARA, Toshiya
(author) (
この著者で検索
)
https://orcid.org/0000-0002-7376-6571
NIMS Researchers Directory SAMURAI
OGIWARA, Toshiya
;
TANUMA, Shigeo
(author) (
この著者で検索
)
https://orcid.org/0000-0003-2628-9941
NIMS Researchers Directory SAMURAI
TANUMA, Shigeo
キーワード
depth resolution function
,
InP/GaInAsP multilayer specimens
,
Auger depth profiling analysis
,
surface roughness
,
atomic force microscope
刊行年月日
2011-06-10
更新時刻
2022-10-03 01:24:02 +0900
キーワード
atomic force microscope
(2)
Auger depth profiling analysis
(1)
InP/GaInAsP multilayer specimens
(1)
N-oxide, diblock copolymer
(1)
cell spheroid
(1)
depth resolution function
(1)
protein adsorption
(1)
sum frequency generation
(1)
surface roughness
(1)
RDEメタデータ定義
RDE送り状
<
1
>
絞り込み
コレクション
資源タイプ
ジャーナル論文(2)
キーワード
atomic force microscope (2)
Auger depth profiling analysis (1)
InP/GaInAsP multilayer specimens (1)
N-oxide, diblock copolymer (1)
cell spheroid (1)
depth resolution function (1)
protein adsorption (1)
sum frequency generation (1)
surface roughness (1)
(more)
ライセンス
In Copyright (1)
ファイル種別
application/pdf (1)
application/vnd.openxmlformats-officedocument.wordprocessingml.document (1)