4 records found.
Stable and high current emission of electrons from a HfC nanoneedle field-emitter fabricated by focused ion beam
- Article
- Creator
-
Shuai Tang
;
Jie Tang
;
Yimeng Wu
;
You-Hu Chen
;
Jun Uzuhashi
;
Tadakatsu Ohkubo
;
Masaki Takeguchi
;
Lu-Chang Qin
- Keyword
- electron emission, transmission electron microscopy, focused ion beam
- Date published
- 2025-03-06
- Updated at
- 2025-04-12 08:30:10 +0900
Experimental investigation and simulation of SEM image intensity behaviors for developing thickness-controlled S/TEM lamella preparation via FIB-SEM
- Article
- Creator
-
Jun Uzuhashi
;
Yuanzhao Yao
;
Tadakatsu Ohkubo
;
Takashi Sekiguchi
- Keyword
- transmission electron microscopy, scanning electron microscopy, focused ion beam
- Date published
- 2025-08-01
- Updated at
- 2026-01-31 16:30:04 +0900
An Automated Site-Specific Tip Preparation Method for Atom Probe Tomography Using Script-Controlled Focused Ion Beam/Scanning Electron Microscopy
- Article
- Creator
-
Jun Uzuhashi
;
Tadakatsu Ohkubo
;
Kazuhiro Hono
- Keyword
- atom probe tomography, focused ion beam, scanning electron microscopy
- Date published
- 2025-02-03
- Updated at
- 2024-09-05 08:30:18 +0900
Development of automated tip preparation for atom probe tomography by using script-controlled FIB-SEM
- Article
- Creator
-
Jun Uzuhashi
;
Tadakatsu Ohkubo
;
Kazuhiro Hono
- Keyword
- atom probe tomography, focused ion beam, scanning electron microscopy, automation
- Date published
- 2023-02-19
- Updated at
- 2025-02-23 22:51:16 +0900