About
Help
Contact
表示言語の変更
日本語
English
Search MDR
Home
Article and Dataset
Collection
Resource type
Article(4)
Keyword
scanning electron microscopy (4)
focused ion beam (3)
atom probe tomography (2)
automation (1)
cell attachment (1)
differential pulse voltammetry (1)
electrochemical analysis (1)
nanostructure (1)
outer-membrane cytochrome (1)
transmission electron microscopy (1)
(more)
License
In Copyright (2)
Creative Commons BY Attribution 4.0 International (1)
Creative Commons BY-NC-ND Attribution-NonCommercial-NoDerivs 4.0 International (1)
File type
application/pdf (4)
Resource type: journal_article
Keyword: scanning electron microscopy
Reset all filters
4 records found.
Experimental investigation and simulation of SEM image intensity behaviors for developing thickness-controlled S/TEM lamella preparation via FIB-SEM
Article
Creator
Jun Uzuhashi
; Yuanzhao Yao ;
Tadakatsu Ohkubo
; Takashi Sekiguchi
Keyword
transmission electron microscopy
,
scanning electron microscopy
,
focused ion beam
Date published
2025-08-01
Updated at
2026-01-31 16:30:04 +0900
Nanowire Electrode Structures Enhanced Direct Extracellular Electron Transport via Cell-Surface Multi-Heme Cytochromes in Desulfovibrio ferrophilus IS5
Article
Creator
Xiao Deng
;
Wipakorn Jevasuwan
;
Naoki Fukata
;
Akihiro Okamoto
Keyword
cell attachment
,
differential pulse voltammetry
,
electrochemical analysis
,
nanostructure
,
outer-membrane cytochrome
,
scanning electron microscopy
Date published
2024-08-13
Updated at
2024-09-03 08:30:25 +0900
An Automated Site-Specific Tip Preparation Method for Atom Probe Tomography Using Script-Controlled Focused Ion Beam/Scanning Electron Microscopy
Article
Creator
Jun Uzuhashi
;
Tadakatsu Ohkubo
;
Kazuhiro Hono
Keyword
atom probe tomography
,
focused ion beam
,
scanning electron microscopy
Date published
2025-02-03
Updated at
2024-09-05 08:30:18 +0900
Development of automated tip preparation for atom probe tomography by using script-controlled FIB-SEM
Article
Creator
Jun Uzuhashi
;
Tadakatsu Ohkubo
;
Kazuhiro Hono
Keyword
atom probe tomography
,
focused ion beam
,
scanning electron microscopy
,
automation
Date published
2023-02-19
Updated at
2025-02-23 22:51:16 +0900
Keyword
scanning electron microscopy
(4)
focused ion beam
(3)
atom probe tomography
(2)
automation
(1)
cell attachment
(1)
differential pulse voltammetry
(1)
electrochemical analysis
(1)
nanostructure
(1)
outer-membrane cytochrome
(1)
transmission electron microscopy
(1)
RDE metadata def
RDE invoice schema
<
1
>