- electron energy loss spectroscopy (4)
- Crystallographic defects (1)
- Electrical properties and parameters (1)
- Electronic bandstructure (1)
- First-principle calculations (1)
- Random access memory (1)
- Resistive switching (1)
- Thermally stimulated current spectroscopy (1)
- Transmission electron microscope (1)
- boron vacancy (1)
4 records found.
Observation of Boron Vacancy Concentration in Hexagonal Boron Nitride at Nanometer Scale
- Journal article
- Creator
-
Jun Kikkawa (author) (Search by this author)Center for Basic Research on Materials/Advanced Materials Characterization Field/Electron Microscopy Group, National Institute for Materials Science
;
Chikara Shinei (author) (Search by this author)Research Center for Electronic and Optical Materials/Optical Materials Field/Semiconductor Defect Design Group, National Institute for Materials Science
;
Jun Chen (author) (Search by this author)Research Center for Electronic and Optical Materials/Optical Materials Field/Semiconductor Defect Design Group, National Institute for Materials Science
;
;Yuta Masuyama (author) (Search by this author)National Institutes for Quantum Science and Technology;Yuichi Yamazaki (author) (Search by this author)National Institutes for Quantum Science and Technology;Teruyasu Mizoguchi (author) (Search by this author)Univ. Tokyo, Institute for Industrial ScienceKoji Kimoto (author) (Search by this author)Center for Basic Research on Materials, National Institute for Materials Science
;
Takashi Taniguchi (author) (Search by this author)Research Center for Materials Nanoarchitectonics (MANA), National Institute for Materials Science
;
Tokuyuki Teraji (author) (Search by this author)Research Center for Electronic and Optical Materials/Optical Materials Field/Semiconductor Defect Design Group, National Institute for Materials Science
- Keyword
- hexagonal boronnitride, boron vacancy, electron energy loss spectroscopy, scanning transmission electron microscopy, frist-principles simulation
- Date published
- 2025-09-03
- Updated at
- 2025-09-08 13:41:17 +0900
Quantitative Characterization by Transmission Electron Microscopy and Its Application to Interfacial Phenomena in Crystalline Materials
- Journal article
- Creator
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Seiichiro Ii (author) (Search by this author)National Institute for Materials Science
- Keyword
- transmission electron microscopy, energy dispersive X-ray spectroscopy, electron energy loss spectroscopy, grain boundary, interphase boundary
- Date published
- 2024-01-25
- Updated at
- 2024-04-02 16:30:27 +0900
Fast electron damage mechanism of epoxy resin studied by electron energy loss spectroscopy and electron diffraction
- Journal article
- Creator
-
Jun Kikkawa (author) (Search by this author)National Institute for Materials Science
;
;Aoi Nii (author) (Search by this author);Yoshiaki Sakaniwa (author) (Search by this author);Naochika Kon (author) (Search by this author);Marina Sakamaki (author) (Search by this author);Touyou Ohashi (author) (Search by this author);Nobuyasu Nita (author) (Search by this author)Koji Harano (author) (Search by this author)National Institute for Materials Science
;
Koji Kimoto (author) (Search by this author)National Institute for Materials Science
- Keyword
- epoxy resin, electron energy loss spectroscopy, fast electron damage, π electron
- Date published
- 2023-11-07
- Updated at
- 2024-01-05 22:12:30 +0900
Conduction band caused by oxygen vacancies in aluminum oxide for resistance random access memory
- Journal article
- Creator
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;Kubota, Masato (author) (Search by this author);Nigo, Seisuke (author) (Search by this author)Kitazawa, Hideaki (author) (Search by this author)
;
Harada, Yoshitomo (author) (Search by this author)
;
;Kido, Giyuu (author) (Search by this author);Hirayama, Taisei (author) (Search by this author)Kato, Seiichi (author) (Search by this author)
- Keyword
- Crystallographic defects, Random access memory, Electrical properties and parameters, First-principle calculations, electron energy loss spectroscopy, Electronic bandstructure, semiconductor structures, Resistive switching, Thermally stimulated current spectroscopy, Transmission electron microscope
- Date published
- 2012-08-01
- Updated at
- 2024-01-05 22:12:58 +0900