Keyword: scanning transmission electron microscopy

7 records found. Displaying records 1 to 7.

Small Methods - 2025 - Kimoto - Unveiling Twist Domains in Monolayer MoS2 through 4D‐STEM and Unsupervised Machine Learning.pdf
Unveiling Twist Domains in Monolayer MoS2 through 4D‐STEM and Unsupervised Machine Learning
Journal article
Creator
ORCID SAMURAI ; ORCID SAMURAI ; ORCID SAMURAI ; ORCID SAMURAI ; ORCID SAMURAI ;
Kohei Aso (author) (Search by this author)
ORCID ;
Yoshifumi Oshima (author) (Search by this author)
ORCID ;
Takashi Matsumoto (author) (Search by this author)
ORCID ; ORCID SAMURAI
Keyword
4D-STEM, dichalcogenide, metal–organic chemical vapor deposition, MoS2,, scanning transmission electron microscopy, unsupervised machine learning
Date published
2025-08-06
Updated at
2025-08-27 12:30:17 +0900

Acceptor activation of Mg-doped GaN – Effects of N2-O2 vs N2 as ambient gas during annealing.pdf
Acceptor activation of Mg-doped GaN—Effects of N2/O2 vs N2 as ambient gas during annealing
Journal article
Creator
Ashutosh Kumar (author) (Search by this author)
National Institute for Materials Science
ORCID ;
Martin Berg (author) (Search by this author)
;
Qin Wang (author) (Search by this author)
;
Jun Uzuhashi (author) (Search by this author)
ORCID SAMURAI ;
Tadakatsu Ohkubo (author) (Search by this author)
ORCID SAMURAI ;
Michael Salter (author) (Search by this author)
;
Peter Ramvall (author) (Search by this author)
Keyword
gallium nitride, scanning transmission electron microscopy, semiconductor, activation
Date published
2023-07-21
Updated at
2024-01-05 22:12:15 +0900

kikkawa-et-al-2025-observation-of-boron-vacancy-concentration-in-hexagonal-boron-nitride-at-nanometer-scale.pdf
Observation of Boron Vacancy Concentration in Hexagonal Boron Nitride at Nanometer Scale
Journal article
Creator
Jun Kikkawa (author) (Search by this author)
Center for Basic Research on Materials/Advanced Materials Characterization Field/Electron Microscopy Group, National Institute for Materials Science
ORCID SAMURAI ;
Chikara Shinei (author) (Search by this author)
Research Center for Electronic and Optical Materials/Optical Materials Field/Semiconductor Defect Design Group, National Institute for Materials Science
ORCID SAMURAI ;
Jun Chen (author) (Search by this author)
Research Center for Electronic and Optical Materials/Optical Materials Field/Semiconductor Defect Design Group, National Institute for Materials Science
ORCID SAMURAI ;
Yuta Masuyama (author) (Search by this author)
National Institutes for Quantum Science and Technology
;
Yuichi Yamazaki (author) (Search by this author)
National Institutes for Quantum Science and Technology
;
Teruyasu Mizoguchi (author) (Search by this author)
Univ. Tokyo, Institute for Industrial Science
;
Koji Kimoto (author) (Search by this author)
Center for Basic Research on Materials, National Institute for Materials Science
ORCID SAMURAI ;
Takashi Taniguchi (author) (Search by this author)
Research Center for Materials Nanoarchitectonics (MANA), National Institute for Materials Science
ORCID SAMURAI ;
Tokuyuki Teraji (author) (Search by this author)
Research Center for Electronic and Optical Materials/Optical Materials Field/Semiconductor Defect Design Group, National Institute for Materials Science
ORCID SAMURAI
Keyword
hexagonal boronnitride, boron vacancy, electron energy loss spectroscopy, scanning transmission electron microscopy, frist-principles simulation
Date published
2025-09-03
Updated at
2025-09-08 13:41:17 +0900

1-s2.0-S0968432825001064-main (final).pdf
Liquid-cell annular dark-field scanning transmission electron microscopy imaging of single crystal samples on a low-index zone-axis incidence condition
Journal article
Creator
Masaki Takeguchi (author) (Search by this author)
Research Center for Energy and Environmental Materials (GREEN)/Battery and Cell Materials Field/Environment-Controlled Microscopy Group, National Institute for Materials Science
ORCID SAMURAI ;
Jonathan Lueke (author) (Search by this author)
Norcada (Canada)
;
Matthew Reynolds (author) (Search by this author)
Norcada (Canada)
;
Baibing Zhao (author) (Search by this author)
KITANO SEIKI Ltd
;
Ayako Hashimoto (author) (Search by this author)
Research Center for Energy and Environmental Materials (GREEN)/Battery and Cell Materials Field/Environment-Controlled Microscopy Group, National Institute for Materials Science
ORCID SAMURAI
Keyword
liquid-cell, scanning transmission electron microscopy, zone-axis incidence, atomic resolution
Date published
2025-07-17
Updated at
2025-10-01 12:30:18 +0900

Atomic-scale investigation of implanted Mg in GaN through ultra-high-pressure annealing.pdf
Atomic-scale investigation of implanted Mg in GaN through ultra-high-pressure annealing
Journal article
Creator
Jun Uzuhashi (author) (Search by this author)
ORCID SAMURAI ;
Jun Chen (author) (Search by this author)
ORCID SAMURAI ;
Ashutosh Kumar (author) (Search by this author)
National Institute for Materials Science
ORCID ;
Wei Yi (author) (Search by this author)
National Institute for Materials Science
ORCID ;
Tadakatsu Ohkubo (author) (Search by this author)
ORCID SAMURAI ;
Ryo Tanaka (author) (Search by this author)
;
Shinya Takashima (author) (Search by this author)
;
Masaharu Edo (author) (Search by this author)
;
Kacper Sierakowski (author) (Search by this author)
;
Michal Bockowski (author) (Search by this author)
;
Hideki Sakurai (author) (Search by this author)
;
Tetsu Kachi (author) (Search by this author)
;
Takashi Sekiguchi (author) (Search by this author)
National Institute for Materials Science
ORCID ;
Kazuhiro Hono (author) (Search by this author)
ORCID SAMURAI
Keyword
gallium nitride, implantation, atom probe tomography, cathodoluminescence, scanning transmission electron microscopy
Date published
2022-05-14
Updated at
2024-01-05 22:11:22 +0900

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