Temperature- and depth-dependent valence band electronic structures of half-metallic studied by hard x-ray photoemission spectroscopy
- Journal article
- Creator
-
Shigenori Ueda (author) (Search by this author)
;
Yuichi Fujita (author) (Search by this author)
;
Ivan Kurniawan (author) (Search by this author)
;
Yuya Sakuraba (author) (Search by this author)
;
Yoshio Miura (author) (Search by this author)
- Keyword
- Co2MnSi, HAXPES, Temperature dependence, Interface and bulk electronic states, interface and bulk magnetic properties, X-ray polarization dependence
- Date published
- 2026-02-18
- Updated at
- 2026-02-21 08:30:04 +0900
Near-interface electronic and magnetic states of insulator/Co2MnSi structures probed by hard x-ray photoemission combined with x-ray total reflection
- Journal article
- Creator
-
Shigenori Ueda (author) (Search by this author)Research Center for Electronic and Optical Materials/Functional Materials Field/Electro-ceramics Group, National Institute for Materials Science
;
Yuichi Fujita (author) (Search by this author)Global Networking Division/International Center for Young Scientists, National Institute for Materials Science
;
Yuya Sakuraba (author) (Search by this author)Research Center for Magnetic and Spintronic Materials/Magnetic Functional Device Group, National Institute for Materials Science
- Keyword
- insulator/Co2MnSi heterostructures, interface and bulk electronic and magnetic states, HAXPES, X-ray total reflection, SX-ARPES
- Date published
- 2024-02-07
- Updated at
- 2024-02-13 09:11:36 +0900
Polarization-dependent Bulk-sensitive Valence Band Photoemission Spectroscopy and Density Functional Theory Calculations: Part IV. 4f Rare-earths
- Journal article
- Creator
-
Shigenori Ueda (author) (Search by this author)National Institute for Materials Science
;
Ikutaro Hamada (author) (Search by this author)
- Keyword
- HAXPES, 4f rare-earths, valence band, core level, X-ray polarization
- Date published
- 2025-07-15
- Updated at
- 2025-06-27 12:30:24 +0900