2 records found.
Summary of ISO/TC 201 Standard: XX ISO 18118: 2004 — Surface chemical analysis — Auger electron spectroscopy and X-ray photoelectron spectroscopy —Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials
- Journal article
- Creator
-
TANUMA, Shigeo (author) (Search by this author)
- Keyword
- XPS, quantitative surface analysis, X-ray photoelectron spectroscopy, Auger electron spectroscopy, relative sensitivity factor, ISO, International Organization for Standardization, AES
- Date published
- 2005-12-28
- Updated at
- 2024-01-05 22:11:34 +0900
Origin of two-dimensional MXene/ferromagnetic interface evaluated by angle-dependent hard X-ray photoemission spectroscopy
- Journal article
- Creator
-
Prabhat Kumar (author) (Search by this author)
https://orcid.org/0000-0003-3897-193X
(unauthenticated)
;
Shunsuke Tsuda (author) (Search by this author)
;
Koichiro Yaji (author) (Search by this author)
;
Shinji Isogami (author) (Search by this author)
- Keyword
- MXene, Interface, XPS
- Date published
- 2025-12-31
- Updated at
- 2025-09-16 12:30:22 +0900