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Resource type
Journal article(2)
Keyword
XPS (2)
AES (1)
Auger electron spectroscopy (1)
ISO (1)
Interface (1)
International Organization for Standardization (1)
MXene (1)
X-ray photoelectron spectroscopy (1)
quantitative surface analysis (1)
relative sensitivity factor (1)
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Creative Commons BY Attribution 4.0 International (1)
In Copyright (1)
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Keyword: XPS
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2 records found.
Summary of ISO/TC 201 Standard: XX ISO 18118: 2004 — Surface chemical analysis — Auger electron spectroscopy and X-ray photoelectron spectroscopy —Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials
Journal article
Creator
TANUMA, Shigeo
(author) (
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)
https://orcid.org/0000-0003-2628-9941
NIMS Researchers Directory SAMURAI
TANUMA, Shigeo
Keyword
XPS
,
quantitative surface analysis
,
X-ray photoelectron spectroscopy
,
Auger electron spectroscopy
,
relative sensitivity factor
,
ISO
,
International Organization for Standardization
,
AES
Date published
2005-12-28
Updated at
2024-01-05 22:11:34 +0900
Origin of two-dimensional MXene/ferromagnetic interface evaluated by angle-dependent hard X-ray photoemission spectroscopy
Journal article
Creator
Prabhat Kumar
(author) (
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)
https://orcid.org/0000-0003-3897-193X
(unauthenticated)
Prabhat Kumar
;
Shunsuke Tsuda
(author) (
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)
https://orcid.org/0000-0001-6209-8048
NIMS Researchers Directory SAMURAI
Shunsuke Tsuda
;
Koichiro Yaji
(author) (
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)
https://orcid.org/0000-0002-0721-1316
NIMS Researchers Directory SAMURAI
Koichiro Yaji
;
Shinji Isogami
(author) (
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)
https://orcid.org/0000-0001-7230-6090
NIMS Researchers Directory SAMURAI
Shinji Isogami
Keyword
MXene
,
Interface
,
XPS
Date published
2025-12-31
Updated at
2025-09-16 12:30:22 +0900
Keyword
XPS
(2)
AES
(1)
Auger electron spectroscopy
(1)
ISO
(1)
Interface
(1)
International Organization for Standardization
(1)
MXene
(1)
X-ray photoelectron spectroscopy
(1)
quantitative surface analysis
(1)
relative sensitivity factor
(1)
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