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Journal article(1)
Software(1)
Keyword
electron microscopy (2)
4DSTEM (1)
Wigner distribution deconvolution (1)
aberration correction (1)
atom probe tomography (1)
ptychography (1)
thermoelectric materials (1)
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http://opensource.org/licenses/MIT (1)
In Copyright (1)
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application/octet-stream (1)
application/pdf (1)
image/tiff (1)
text/troff (1)
Measurement method
scanning transmission electron microscopy (1)
Keyword: electron microscopy
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2 records found.
Mechanistic Insight into the Effect of Cu Doping on Thermoelectric Properties of Sintered Wet-Chemically Synthesized SnSe
2
Nanosheets
Journal article
Creator
Simon Moore
(author) (
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Simon Moore
;
Mari Takahashi
(author) (
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)
https://orcid.org/0000-0001-9252-0721
(unauthenticated)
Mari Takahashi
;
Philipp Sauerschnig
(author) (
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)
https://orcid.org/0000-0003-4666-5262
(unauthenticated)
Philipp Sauerschnig
;
Keiji Kobayashi
(author) (
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)
Keiji Kobayashi
;
Koichi Higashimine
(author) (
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)
Koichi Higashimine
;
Masanobu Miyata
(author) (
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)
Masanobu Miyata
;
Takahiro Baba
(author) (
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)
Takahiro Baba
;
Jun Uzuhashi
(author) (
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)
https://orcid.org/0000-0003-2023-8158
NIMS Researchers Directory SAMURAI
Jun Uzuhashi
;
Michihiro Ohta
(author) (
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)
https://orcid.org/0000-0002-9093-7117
(unauthenticated)
Michihiro Ohta
;
Takao Mori
(author) (
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)
https://orcid.org/0000-0003-2682-1846
NIMS Researchers Directory SAMURAI
Takao Mori
;
Tadakatsu Ohkubo
(author) (
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)
https://orcid.org/0000-0003-3548-1951
NIMS Researchers Directory SAMURAI
Tadakatsu Ohkubo
;
Shinya Maenosono
(author) (
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)
https://orcid.org/0000-0003-2669-8219
(unauthenticated)
Shinya Maenosono
Keyword
thermoelectric materials
,
electron microscopy
,
atom probe tomography
Date published
2024-09-09
Updated at
2025-08-26 08:30:23 +0900
Ptychographical reconstruction code by Wigner Distribution Deconvolution (WDD)
Software
Creator
Nakazawa Katsuaki
(author) (
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)
https://orcid.org/0000-0002-6056-5615
ICYS, National Institute for Materials Science
NIMS Researchers Directory SAMURAI
Nakazawa Katsuaki
;
Mitsuishi Kazutaka
(author) (
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)
https://orcid.org/0000-0002-9361-4057
Research Center for Advanced Measurement and Characterization, National Institute for Materials Science
NIMS Researchers Directory SAMURAI
Mitsuishi Kazutaka
Keyword
ptychography
,
4DSTEM
,
electron microscopy
,
Wigner distribution deconvolution
,
aberration correction
Date published
2022-11-30
Updated at
2023-02-03 17:43:11 +0900
Keyword
electron microscopy
(2)
4DSTEM
(1)
Wigner distribution deconvolution
(1)
aberration correction
(1)
atom probe tomography
(1)
ptychography
(1)
thermoelectric materials
(1)
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