ソフトウェア Ptychographical reconstruction code by Wigner Distribution Deconvolution (WDD)

Nakazawa Katsuaki SAMURAI ORCID (ICYS, National Institute for Materials ScienceROR) ; Mitsuishi Kazutaka SAMURAI ORCID (Research Center for Advanced Measurement and Characterization, National Institute for Materials ScienceROR)

コレクション

引用
Nakazawa Katsuaki, Mitsuishi Kazutaka. Ptychographical reconstruction code by Wigner Distribution Deconvolution (WDD). https://doi.org/10.48505/nims.3859

説明:

(abstract)

Codes for Ptychographical reconstruction by WDD method and aberration measuremnt.

The codes were originally developed by Katsuaki Nakazawa(ICYS fellow at NIMS Japan) and debugged and modified by Kazutaka Mitsuishi (NIMS Japan) based on the following papers and books:

Pennycook, T. J. et al. Efficient phase contrast imaging in STEM using a pixelated detector. Part 1: experimental demonstration at atomic resolution. Ultramicroscopy 151, 160-167, doi:10.1016/j.ultramic.2014.09.013 (2015). Yang, H. et al. Simultaneous atomic-resolution electron ptychography and Z-contrast imaging of light and heavy elements in complex nanostructures. Nat Commun 7, 12532, doi:10.1038/ncomms12532 (2016). Rodenburg, J. & Maiden, A. in Springer handbook of microscopy (eds P. W. Hawkes & John C. H. Spence) Ch. 17, (Springer Nature, 2019). Rodenburg, J. M. Advances in Imaging and Electron Physics 87-184 (2008).

Disclaimer THE SOFTWARE IS PROVIDED "AS IS", WITHOUT WARRANTY OF ANY KIND, EXPRESS OR IMPLIED, INCLUDING BUT NOT LIMITED TO THE WARRANTIES OF MERCHANTABILITY, FITNESS FOR A PARTICULAR PURPOSE AND NONINFRINGEMENT. IN NO EVENT SHALL THE AUTHORS OR COPYRIGHT HOLDERS BE LIABLE FOR ANY CLAIM, DAMAGES OR OTHER LIABILITY, WHETHER IN AN ACTION OF CONTRACT, TORT OR OTHERWISE, ARISING FROM, OUT OF OR IN CONNECTION WITH THE SOFTWARE OR THE USE OR OTHER DEALINGS IN THE SOFTWARE.

権利情報:

キーワード: ptychography, 4DSTEM, electron microscopy, Wigner distribution deconvolution, aberration correction

刊行年月日: 2022-11-30

出版者: National Institute for Materials Science

掲載誌:

  • Scientific reports (ISSN: 20452322) vol. 13 issue. 1 p. 316- 10.1038/s41598-023-27452-3

研究助成金:

  • 日本学術振興会 21K04890 (基盤研究(C))

原稿種別: 論文以外のデータ

MDR DOI: https://doi.org/10.48505/nims.3859

公開URL: https://github.com/Kazu32143952/Ptychography-reconstruction-by-WDD-method-and-aberration-measurement

関連資料:

その他の識別子:

連絡先: Mitsuishi Kazutaka (Research Center for Advanced Measurement and Characterization, National Institute for Materials Science) Mitsuishi.Kazutaka@nims.go.jp

更新時刻: 2023-02-03 17:43:11 +0900

MDRでの公開時刻: 2023-02-06 11:52:38 +0900

Measurement method / 計測法

Description / 説明 : microscopy -- scanning transmission electron microscopy

Category / カテゴリ : 走査透過電子顕微鏡 MatVoc

Category description / カテゴリの説明 :

Analysis field / 解析分野 :

Analysis field description / 解析分野の説明 :

Measurement environment / 計測環境 :

Standarized procedure / 標準手順 :

Measured at / 計測時刻 :

ファイル名 サイズ
ファイル名 Ptychography reconstruction by WDD method and aberration measurement_user guide..ipynb
application/octet-stream
サイズ 885KB 詳細
ファイル名 Ptychography.py
text/troff
サイズ 30.1KB 詳細
ファイル名 stem4d.py (サムネイル)
text/troff
サイズ 4.6KB 詳細
ファイル名 Si110_7x5_128.tif
image/tiff
サイズ 83.4KB 詳細