Nakazawa Katsuaki
(ICYS, National Institute for Materials Science
)
;
Mitsuishi Kazutaka
(Research Center for Advanced Measurement and Characterization, National Institute for Materials Science
)
説明:
(abstract)Codes for Ptychographical reconstruction by WDD method and aberration measuremnt.
The codes were originally developed by Katsuaki Nakazawa(ICYS fellow at NIMS Japan) and debugged and modified by Kazutaka Mitsuishi (NIMS Japan) based on the following papers and books:
Pennycook, T. J. et al. Efficient phase contrast imaging in STEM using a pixelated detector. Part 1: experimental demonstration at atomic resolution. Ultramicroscopy 151, 160-167, doi:10.1016/j.ultramic.2014.09.013 (2015). Yang, H. et al. Simultaneous atomic-resolution electron ptychography and Z-contrast imaging of light and heavy elements in complex nanostructures. Nat Commun 7, 12532, doi:10.1038/ncomms12532 (2016). Rodenburg, J. & Maiden, A. in Springer handbook of microscopy (eds P. W. Hawkes & John C. H. Spence) Ch. 17, (Springer Nature, 2019). Rodenburg, J. M. Advances in Imaging and Electron Physics 87-184 (2008).
Disclaimer THE SOFTWARE IS PROVIDED "AS IS", WITHOUT WARRANTY OF ANY KIND, EXPRESS OR IMPLIED, INCLUDING BUT NOT LIMITED TO THE WARRANTIES OF MERCHANTABILITY, FITNESS FOR A PARTICULAR PURPOSE AND NONINFRINGEMENT. IN NO EVENT SHALL THE AUTHORS OR COPYRIGHT HOLDERS BE LIABLE FOR ANY CLAIM, DAMAGES OR OTHER LIABILITY, WHETHER IN AN ACTION OF CONTRACT, TORT OR OTHERWISE, ARISING FROM, OUT OF OR IN CONNECTION WITH THE SOFTWARE OR THE USE OR OTHER DEALINGS IN THE SOFTWARE.
権利情報:
キーワード: ptychography, 4DSTEM, electron microscopy, Wigner distribution deconvolution, aberration correction
刊行年月日: 2022-11-30
出版者: National Institute for Materials Science
掲載誌:
研究助成金:
原稿種別: 論文以外のデータ
MDR DOI: https://doi.org/10.48505/nims.3859
公開URL: https://github.com/Kazu32143952/Ptychography-reconstruction-by-WDD-method-and-aberration-measurement
関連資料:
その他の識別子:
連絡先: Mitsuishi Kazutaka (Research Center for Advanced Measurement and Characterization, National Institute for Materials Science) Mitsuishi.Kazutaka@nims.go.jp
更新時刻: 2023-02-03 17:43:11 +0900
MDRでの公開時刻: 2023-02-06 11:52:38 +0900
Description / 説明 : microscopy -- scanning transmission electron microscopy
Category /
カテゴリ
:
走査透過電子顕微鏡
Category description / カテゴリの説明 :
Analysis field / 解析分野 :
Analysis field description / 解析分野の説明 :
Measurement environment / 計測環境 :
Standarized procedure / 標準手順 :
Measured at / 計測時刻 :
| ファイル名 | サイズ | |||
|---|---|---|---|---|
| ファイル名 |
Ptychography reconstruction by WDD method and aberration measurement_user guide..ipynb
application/octet-stream |
サイズ | 885KB | 詳細 |
| ファイル名 |
Ptychography.py
text/troff |
サイズ | 30.1KB | 詳細 |
| ファイル名 |
stem4d.py
(サムネイル)
text/troff |
サイズ | 4.6KB | 詳細 |
| ファイル名 |
Si110_7x5_128.tif
image/tiff |
サイズ | 83.4KB | 詳細 |