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Codes for Ptychographical reconstruction by WDD method and aberration measuremnt.

The codes were originally developed by Katsuaki Nakazawa(ICYS fellow at NIMS Japan) and debugged and modified by Kazutaka Mitsuishi (NIMS Japan) based on the following papers and books:

Pennycook, T. J. et al. Efficient phase contrast imaging in STEM using a pixelated detector. Part 1: experimental demonstration at atomic resolution. Ultramicroscopy 151, 160-167, doi:10.1016/j.ultramic.2014.09.013 (2015). Yang, H. et al. Simultaneous atomic-resolution electron ptychography and Z-contrast imaging of light and heavy elements in complex nanostructures. Nat Commun 7, 12532, doi:10.1038/ncomms12532 (2016). Rodenburg, J. & Maiden, A. in Springer handbook of microscopy (eds P. W. Hawkes & John C. H. Spence) Ch. 17, (Springer Nature, 2019). Rodenburg, J. M. Advances in Imaging and Electron Physics 87-184 (2008).

Disclaimer THE SOFTWARE IS PROVIDED "AS IS", WITHOUT WARRANTY OF ANY KIND, EXPRESS OR IMPLIED, INCLUDING BUT NOT LIMITED TO THE WARRANTIES OF MERCHANTABILITY, FITNESS FOR A PARTICULAR PURPOSE AND NONINFRINGEMENT. IN NO EVENT SHALL THE AUTHORS OR COPYRIGHT HOLDERS BE LIABLE FOR ANY CLAIM, DAMAGES OR OTHER LIABILITY, WHETHER IN AN ACTION OF CONTRACT, TORT OR OTHERWISE, ARISING FROM, OUT OF OR IN CONNECTION WITH THE SOFTWARE OR THE USE OR OTHER DEALINGS IN THE SOFTWARE.

Rights:

• http://opensource.org/licenses/MIT
  

  MIT License

Keyword: ptychography, 4DSTEM, electron microscopy, Wigner distribution deconvolution, aberration correction

Date published: 2022-11-30

Publisher: National Institute for Materials Science

Journal:

• Scientific reports (ISSN: 20452322) vol. 13 issue. 1 p. 316- 10.1038/s41598-023-27452-3

Funding:

• 日本学術振興会 21K04890 (基盤研究（C）)

Manuscript type: Not a journal article

MDR DOI: https://doi.org/10.48505/nims.3859

First published URL: https://github.com/Kazu32143952/Ptychography-reconstruction-by-WDD-method-and-aberration-measurement

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Contact agent: Mitsuishi Kazutaka (Research Center for Advanced Measurement and Characterization, National Institute for Materials Science) Mitsuishi.Kazutaka@nims.go.jp

Updated at: 2023-02-03 17:43:11 +0900

Published on MDR: 2023-02-06 11:52:38 +0900