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Resource type
Journal article(2)
Keyword
dislocation (2)
Ga2O3 (1)
InGaN (1)
atom probe tomography (1)
pipe diffusion (1)
transmission electron microscopy (1)
(more)
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Creative Commons BY Attribution 4.0 International (1)
Creative Commons BY-NC-ND Attribution-NonCommercial-NoDerivs 4.0 International (1)
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application/pdf (2)
Keyword: dislocation
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2 records found.
Luminescence properties of dislocations in α-Ga
2
O
3
Journal article
Creator
Mugove Maruzane
(author) (
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)
https://orcid.org/0009-0004-9207-0424
(unauthenticated)
Mugove Maruzane
;
Yuichi Oshima
(author) (
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)
https://orcid.org/0000-0001-8293-4891
NIMS Researchers Directory SAMURAI
Yuichi Oshima
;
Olha Makydonska
(author) (
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)
https://orcid.org/0009-0008-5562-2137
(unauthenticated)
Olha Makydonska
;
Paul R Edwards
(author) (
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)
https://orcid.org/0000-0001-7671-7698
(unauthenticated)
Paul R Edwards
;
Robert W Martin
(author) (
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)
https://orcid.org/0000-0002-6119-764X
(unauthenticated)
Robert W Martin
;
Fabien C-P Massabuau
(author) (
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)
https://orcid.org/0000-0003-1008-1652
(unauthenticated)
Fabien C-P Massabuau
Keyword
Ga2O3
,
dislocation
Date published
2025-01-20
Updated at
2024-11-13 08:31:40 +0900
Atomic Diffusion of Indium through Threading Dislocations in InGaN Quantum Wells
Journal article
Creator
Yudai Yamaguchi
(author) (
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)
Yudai Yamaguchi
;
Yuya Kanitani
(author) (
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)
Yuya Kanitani
;
Yoshihiro Kudo
(author) (
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)
Yoshihiro Kudo
;
Jun Uzuhashi
(author) (
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)
https://orcid.org/0000-0003-2023-8158
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
Jun Uzuhashi
;
Tadakatsu Ohkubo
(author) (
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)
https://orcid.org/0000-0003-3548-1951
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
Tadakatsu Ohkubo
;
Kazuhiro Hono
(author) (
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)
https://orcid.org/0000-0001-7367-0193
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
Kazuhiro Hono
;
Shigetaka Tomiya
(author) (
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)
Shigetaka Tomiya
Keyword
InGaN
,
dislocation
,
pipe diffusion
,
atom probe tomography
,
transmission electron microscopy
Date published
2022-09-14
Updated at
2024-01-05 22:12:51 +0900
Keyword
dislocation
(2)
Ga2O3
(1)
InGaN
(1)
atom probe tomography
(1)
pipe diffusion
(1)
transmission electron microscopy
(1)
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