Approaching the Intrinsic Properties of Moiré Structures Using Atomic Force Microscopy Ironing
- Journal article
- Creator
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;Swaroop Kumar Palai (author) (Search by this author);Mateusz Dyksik (author) (Search by this author);Nikodem Sokolowski (author) (Search by this author);Mariusz Ciorga (author) (Search by this author);Estrella Sánchez Viso (author) (Search by this author);Yong Xie (author) (Search by this author);Alina Schubert (author) (Search by this author)Takashi Taniguchi (author) (Search by this author)National Institute for Materials Science
;
Kenji Watanabe (author) (Search by this author)National Institute for Materials Science
;
;Duncan K. Maude (author) (Search by this author);Alessandro Surrente (author) (Search by this author);Michał Baranowski (author) (Search by this author);Andres Castellanos-Gomez (author) (Search by this author);Carmen Munuera (author) (Search by this author)Paulina Plochocka (author) (Search by this author) - Keyword
- Transition metal dichalcogenides, moiré pattern, atomic force microscope
- Date published
- 2023-06-14
- Updated at
- 2025-02-15 12:30:13 +0900
Depth Profiling Analysis of InP/GaInAsP Multilayers by Auger Electron Spectroscopy, Quantitative Evaluation of the Surface Roughness Caused by Ion Sputtering
- Journal article
- Creator
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OGIWARA, Toshiya (author) (Search by this author)
;
TANUMA, Shigeo (author) (Search by this author)
- Keyword
- depth resolution function, InP/GaInAsP multilayer specimens, Auger depth profiling analysis, surface roughness, atomic force microscope
- Date published
- 2011-06-10
- Updated at
- 2022-10-03 01:24:02 +0900