2 records found.
Rapid measurement of low-order aberrations using Fourier transforms of crystalline Ronchigrams
- Journal article
- Creator
-
Koji Kimoto (author) (Search by this author)National Institute for Materials Science
;
Kazuo Ishizuka (author) (Search by this author)HREM Research (Japan) - Keyword
- STEM, alignment, Ronchigram, Aberration
- Date published
- 2017-03-18
- Updated at
- 2024-01-05 22:13:14 +0900
Depth sectioning using environmental and atomic-resolution STEM
- Journal article
- Creator
-
Masaki Takeguchi (author) (Search by this author)National Institute for Materials Science
;
Ayako Hashimoto (author) (Search by this author)National Institute for Materials Science
;
Kazutaka Mitsuishi (author) (Search by this author)National Institute for Materials Science
- Keyword
- Environmental cell, Depth sectioning, STEM, Atomic resolution
- Date published
- 2024-04-08
- Updated at
- 2025-01-22 12:30:14 +0900