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説明:

Depth-sectioning Scanning TEM (STEM) is a promising technique that enhances the signal for a sample embedded in a matrix. It can increase the resolution to the atomic level, thereby enabling EC-STEM applications in important areas. This review introduces depth-sectioning STEM and its applications to high-resolution EC-STEM imaging of samples in gases and liquids.

権利情報:

• In Copyright
  

キーワード: Environmental cell, Depth sectioning, STEM, Atomic resolution

刊行年月日: 2024-04-08

出版者: Oxford University Press (OUP)

掲載誌:

• Microscopy (ISSN: 20505701) vol. 73 issue. 2 p. 145-153

研究助成金:

• Japan Society for the Promotion of Science 21K05248
• Precursory Research for Embryonic Science and Technology JPMJPR17S7
• Adaptable and Seamless Technology Transfer Program through Target-Driven R and D JPMJTM20KU
• Acquisition, Technology & Logistics Agency JPJ004596
• Japan Society for the Promotion of Science 21K05248
• Precursory Research for Embryonic Science and Technology JPMJPR17S7
• Adaptable and Seamless Technology Transfer Program through Target-Driven R and D JPMJTM20KU
• Acquisition, Technology & Logistics Agency JPJ004596

原稿種別: 著者最終稿 (Accepted manuscript)

MDR DOI: https://doi.org/10.48505/nims.4514

公開URL: https://doi.org/10.1093/jmicro/dfae005

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更新時刻: 2025-01-22 12:30:14 +0900

MDRでの公開時刻: 2025-01-22 12:30:15 +0900