Keyword: gallium nitride
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2 records found.

095304_1_5.0224068.pdf
Effects of nitrosyl fluoride based gas treatment on fluorination and redox reaction at GaN surface and Pt/GaN interface
Journal article
Creator
ORCID SAMURAI ; ORCID SAMURAI ;
Takashi Teramoto (author) (Search by this author)
ORCID ;
Dominic Gerlach (author) (Search by this author)
ORCID ;
Peng Shen (author) (Search by this author)
ORCID ; ORCID SAMURAI ;
Takako Kimura (author) (Search by this author)
ORCID ;
Christian Dussarrat (author) (Search by this author)
ORCID ; ORCID SAMURAI
Keyword
gallium nitride, GaN, nitrosyl fluoride, FNO, HAXPES, defect passivation, fluorination
Date published
2025-03-07
Updated at
2025-03-26 17:26:31 +0900
Atomic resolution analysis of extended defects and Mg agglomeration in Mg-ion-implanted GaN and their impacts on acceptor formation.pdf
Atomic resolution analysis of extended defects and Mg agglomeration in Mg-ion-implanted GaN and their impacts on acceptor formation
Journal article
Creator
Emi Kano (author) (Search by this author)
;
Keita Kataoka (author) (Search by this author)
;
Jun Uzuhashi (author) (Search by this author)
National Institute for Materials Science
ORCID SAMURAI ;
Kenta Chokawa (author) (Search by this author)
;
Hideki Sakurai (author) (Search by this author)
;
Akira Uedono (author) (Search by this author)
;
Tetsuo Narita (author) (Search by this author)
;
Kacper Sierakowski (author) (Search by this author)
;
Michal Bockowski (author) (Search by this author)
;
Ritsuo Otsuki (author) (Search by this author)
;
Koki Kobayashi (author) (Search by this author)
;
Yuta Itoh (author) (Search by this author)
;
Masahiro Nagao (author) (Search by this author)
;
Tadakatsu Ohkubo (author) (Search by this author)
National Institute for Materials Science
ORCID SAMURAI ;
Kazuhiro Hono (author) (Search by this author)
National Institute for Materials Science
ORCID SAMURAI ;
Jun Suda (author) (Search by this author)
;
Tetsu Kachi (author) (Search by this author)
;
Nobuyuki Ikarashi (author) (Search by this author)
Keyword
gallium nitride, transmission electron microscopy, atom probe tomography
Date published
2022-08-14
Updated at
2024-01-05 22:13:58 +0900