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Resource type
Journal article(2)
Keyword
XPS (2)
AES (1)
Band bending (1)
IMFP (1)
IMFPs (1)
TPP-2M (1)
binding energy calibration (1)
carbon-related materials (1)
diamond (1)
electron inelastic mean free paths (1)
(more)
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In Copyright (1)
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application/pdf (2)
Keyword: XPS
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2 records found.
Calibration of binding energy and clarification of interfacial band bending for the Al2O3/diamond heterojunction
Journal article
Creator
J. W. Liu
(author) (
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)
https://orcid.org/0000-0003-2580-7401
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
J. W. Liu
;
T. Teraji
(author) (
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)
https://orcid.org/0000-0002-7731-0547
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
T. Teraji
;
B. Da
(author) (
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)
https://orcid.org/0000-0002-0785-8662
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
B. Da
;
Y. Koide
(author) (
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)
https://orcid.org/0000-0001-8321-9822
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
Y. Koide
Keyword
binding energy calibration
,
carbon-related materials
,
XPS
,
diamond
,
Band bending
Date published
2024-09-02
Updated at
2024-09-13 12:30:32 +0900
Calculation of Electron Inelastic Mean Free Paths (IMFPs). VII. Reliability of the TPP-2M IMFP Predictive Equation
Journal article
Creator
Tanuma, Shigeo
(author) (
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)
https://orcid.org/0000-0003-2628-9941
NIMS Researchers Directory SAMURAI
Tanuma, Shigeo
;
Powell, C. J.
(author) (
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)
https://orcid.org/0000-0001-8990-2286
(unauthenticated)
Powell, C. J.
;
Penn, D. R.
(author) (
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)
Penn, D. R.
Keyword
IMFP
,
TPP-2M
,
number of valence electrons
,
elemental solids
,
XPS
,
electron inelastic mean free paths
,
surface sensitivity
,
IMFPs
,
AES
,
surface analysis
Date published
2003-02-11
Updated at
2022-10-03 01:54:38 +0900
Keyword
XPS
(2)
AES
(1)
Band bending
(1)
IMFP
(1)
IMFPs
(1)
TPP-2M
(1)
binding energy calibration
(1)
carbon-related materials
(1)
diamond
(1)
electron inelastic mean free paths
(1)
elemental solids
(1)
number of valence electrons
(1)
surface analysis
(1)
surface sensitivity
(1)
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