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Article and Dataset
Collection
MDR XAFS DB(2)
Resource type
Journal article(5)
Dataset(2)
Keyword
Silicon (7)
BL-10 (2)
Pure metal (2)
Pure metalloid (2)
Ritsumeikan-SR (2)
Si (2)
Si K-edge (2)
XAFS (2)
collection - MDR XAFS DB (2)
All-dielectric (1)
(more)
License
Creative Commons BY Attribution 4.0 International (5)
cc-by-nc-3.0 (1)
In Copyright (1)
File type
application/pdf (5)
application/json (2)
application/octet-stream (2)
image/png (2)
text/tab-separated-values (2)
Chemical composition
Silicon (2)
Analysis field
spectroscopy (2)
Measurement method
x-ray absorption spectroscopy (2)
Material type
Pure metalloid (2)
Structural feature for specimen
local structure (2)
Instrument name
BL-10_XAFS (2)
Keyword: Silicon
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7 records found.
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A model reasoning low-energy track-formation and enhanced nuclear energy loss in Si irradiated with C60 ions
Journal article
Creator
H. Amekura
(author) (
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)
https://orcid.org/0000-0003-2148-8431
NIMS Researchers Directory SAMURAI
H. Amekura
;
K. Narumi
(author) (
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)
https://orcid.org/0000-0001-8569-0108
(unauthenticated)
K. Narumi
;
A. Chiba
(author) (
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)
A. Chiba
;
Y. Hirano
(author) (
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)
Y. Hirano
;
K. Yamada
(author) (
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)
K. Yamada
;
S. Yamamoto
(author) (
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)
S. Yamamoto
;
Y. Saitoh
(author) (
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)
Y. Saitoh
;
H. Segawa
(author) (
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)
https://orcid.org/0000-0002-7198-8410
NIMS Researchers Directory SAMURAI
H. Segawa
Keyword
ion track
,
C60 ion
,
Silicon
,
Synergy effect
,
Cluster effect
Date published
2026-06-17
Updated at
2026-06-18 14:50:54 +0900
Analyses of oxygen precipitates in CZ-Si by X-ray diffuse scattering using parallel X-ray beam
Journal article
Creator
Tomoyuki Horikawa
(author) (
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)
Tomoyuki Horikawa
;
Yoshiyuki Tsusaka
(author) (
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)
Yoshiyuki Tsusaka
;
Junji Matsui
(author) (
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)
Junji Matsui
;
Tetsuya Tohei
(author) (
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)
Tetsuya Tohei
;
Yusuke Hayashi
(author) (
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)
https://orcid.org/0000-0001-5672-1497
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
Yusuke Hayashi
;
Akira Sakai
(author) (
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)
Akira Sakai
Keyword
Silicon
,
X-ray diffuse scattering
Date published
2025-04-01
Updated at
2026-02-14 21:58:00 +0900
Dislocation cluster generation behavior in multicrystalline silicon investigated using twin network analysis
Journal article
Creator
Kazuma Torii
(author) (
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)
a Graduate School of Engineering, Nagoya University
Kazuma Torii
;
Takuto Kojima
(author) (
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)
Takuto Kojima
;
Kentaro Kutsukake
(author) (
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)
Kentaro Kutsukake
;
Hiroaki Kudo
(author) (
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)
Hiroaki Kudo
;
Noritaka Usami
(author) (
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)
Noritaka Usami
Keyword
Silicon
,
dislocation
,
twin grain boundary
,
network analysis
Date published
2025-12-31
Updated at
2025-07-16 16:14:54 +0900
Deep-blue amplified spontaneous emission and lasing in colloidal silicon nanoclusters
Journal article
Creator
Hiroyuki Yamada
(author) (
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)
https://orcid.org/0000-0003-0394-857X
NIMS Researchers Directory SAMURAI
Hiroyuki Yamada
;
Tohru Tsuruoka
(author) (
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)
https://orcid.org/0000-0002-4322-4309
NIMS Researchers Directory SAMURAI
Tohru Tsuruoka
;
Tadaaki Nagao
(author) (
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)
https://orcid.org/0000-0002-6746-2686
NIMS Researchers Directory SAMURAI
Tadaaki Nagao
;
Naoto Shirahata
(author) (
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)
https://orcid.org/0000-0002-1217-7589
NIMS Researchers Directory SAMURAI
Naoto Shirahata
Keyword
Nanoparticle
,
Amplified spontaneous emission
,
Lasing
,
Blue laser
,
Laser ablation
,
Silicon
Date published
2025-04-14
Updated at
2025-05-07 16:30:09 +0900
Low-Contrast BIC Metasurfaces with Quality Factors Exceeding 100,000
Journal article
Creator
Keisuke Watanabe
(author) (
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)
https://orcid.org/0000-0002-4285-2135
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
Keisuke Watanabe
;
Tadaaki Nagao
(author) (
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)
https://orcid.org/0000-0002-6746-2686
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
Tadaaki Nagao
;
Masanobu Iwanaga
(author) (
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)
https://orcid.org/0000-0002-8930-6940
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
Masanobu Iwanaga
Keyword
Metasurfaces
,
Bound states in the continuum
,
Q factors
,
All-dielectric
,
Silicon
,
Biosensors
Date published
2025-02-19
Updated at
2025-02-23 22:49:30 +0900
XAFS spectrum of Silicon
Dataset
Collection
MDR XAFS DB
Creator
Masashi Ishii
(editor) (
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)
https://orcid.org/0000-0003-0357-2832
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
Masashi Ishii
;
Ritsumeikan SR Center
(author) (
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)
Ritsumeikan University
Ritsumeikan SR Center
Keyword
Silicon (powder)
,
Si
,
Si K-edge
,
Pure metal
,
BL-10
,
Ritsumeikan-SR
,
XAFS
,
collection - MDR XAFS DB
,
Silicon
,
Pure metalloid
Date published
Updated at
2025-05-02 21:46:28 +0900
XAFS spectrum of Silicon
Dataset
Collection
MDR XAFS DB
Creator
Masashi Ishii
(editor) (
Search by this author
)
https://orcid.org/0000-0003-0357-2832
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
Masashi Ishii
;
Ritsumeikan SR Center
(author) (
Search by this author
)
Ritsumeikan University
Ritsumeikan SR Center
Keyword
Silicon (wafer)
,
Si
,
Si K-edge
,
Pure metal
,
BL-10
,
Ritsumeikan-SR
,
XAFS
,
collection - MDR XAFS DB
,
Silicon
,
Pure metalloid
Date published
Updated at
2025-05-02 21:52:42 +0900
Keyword
Silicon
(7)
BL-10
(2)
Pure metal
(2)
Pure metalloid
(2)
Ritsumeikan-SR
(2)
Si
(2)
Si K-edge
(2)
XAFS
(2)
collection - MDR XAFS DB
(2)
All-dielectric
(1)
Amplified spontaneous emission
(1)
Biosensors
(1)
Blue laser
(1)
Bound states in the continuum
(1)
C60 ion
(1)
Cluster effect
(1)
Laser ablation
(1)
Lasing
(1)
Metasurfaces
(1)
Nanoparticle
(1)
Q factors
(1)
Silicon (powder)
(1)
Silicon (wafer)
(1)
Synergy effect
(1)
X-ray diffuse scattering
(1)
dislocation
(1)
ion track
(1)
network analysis
(1)
twin grain boundary
(1)
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Collection
MDR XAFS DB(2)
Resource type
Journal article(5)
Dataset(2)
Keyword
Silicon (7)
BL-10 (2)
Pure metal (2)
Pure metalloid (2)
Ritsumeikan-SR (2)
Si (2)
Si K-edge (2)
XAFS (2)
collection - MDR XAFS DB (2)
All-dielectric (1)
(more)
License
Creative Commons BY Attribution 4.0 International (5)
cc-by-nc-3.0 (1)
In Copyright (1)
File type
application/pdf (5)
application/json (2)
application/octet-stream (2)
image/png (2)
text/tab-separated-values (2)
Chemical composition
Silicon (2)
Analysis field
spectroscopy (2)
Measurement method
x-ray absorption spectroscopy (2)
Material type
Pure metalloid (2)
Structural feature for specimen
local structure (2)
Instrument name
BL-10_XAFS (2)