42 records found.
Sample structure prediction from measured XPS data using Bayesian estimation and SESSA simulator
- Journal article
- Creator
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Hiroshi Shinotsuka (author) (Search by this author)Research and Services Division of Materials Data and Integrated System, National Institute for Materials Science
;
Kenji Nagata (author) (Search by this author)Research and Services Division of Materials Data and Integrated System, National Institute for Materials Science
;
;Malinda Siriwardana (author) (Search by this author)Research and Services Division of Materials Data and Integrated System, National Institute for Materials ScienceHideki Yoshikawa (author) (Search by this author)Research and Services Division of Materials Data and Integrated System, National Institute for Materials Science
;
Hayaru Shouno (author) (Search by this author)
https://orcid.org/0000-0002-2412-0184
(unauthenticated)
Graduate School of Informatics and Engineering, The University of Electro-Communications
;
Masato Okada (author) (Search by this author)
https://orcid.org/0000-0002-9040-8784
(unauthenticated)
Graduate School of Frontier Science, The University of Tokyo
- Keyword
- X-ray photoelectron spectroscopy, Bayesian estimation, Exchange Monte Carlo method, SESSA
- Date published
- 2023-07-06
- Updated at
- 2024-01-05 22:11:57 +0900
Raw data files for Fig. 12 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
- Dataset
- Creator
-
OGIWARA, Toshiya (author) (Search by this author)National Institute for Materials Science
;
NAGATA, Takahiro (author) (Search by this author)National Institute for Materials Science
;
YOSHIKAWA, Hideki (author) (Search by this author)National Institute for Materials Science
- Keyword
- Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
- Date published
- 2019-03-07
- Updated at
- 2024-01-05 22:13:20 +0900
Raw data files for Fig. 11 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
- Dataset
- Creator
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OGIWARA, Toshiya (author) (Search by this author)National Institute for Materials Science
;
NAGATA, Takahiro (author) (Search by this author)National Institute for Materials Science
;
YOSHIKAWA, Hideki (author) (Search by this author)National Institute for Materials Science
- Keyword
- Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
- Date published
- 2019-03-07
- Updated at
- 2024-04-07 22:57:41 +0900
Inelastic Mean Free Paths, Mean Escape Depths, and Effective Attenuation Lengths for Surface Electron Spectroscopies
- Conference presentation
- Creator
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田沼 繁夫 (author) (Search by this author)
;
;後藤啓典 (author) (Search by this author)産総研吉川 英樹 (author) (Search by this author)
;
;パウエル (author) (Search by this author)NIST;Penn, D. R. (author) (Search by this author)NIST;Da, B. (author) (Search by this author)物質・材料研究機構;Ueda, R. (author) (Search by this author)物質・材料研究機構Shinotsuka, H (author) (Search by this author)物質・材料研究機構
- Keyword
- EPES, IMFP, EAL, elemental solids, inorganic compounds, water
- Date published
- Updated at
- 2023-06-29 11:57:06 +0900
Electron Inelastic Mean Free Paths in Liquid Water for Energies from10 eV to 10 keV
- Conference presentation
- Creator
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TANUMA, Shigeo (author) (Search by this author)表面化学分析グループ, National Institute for Materials Science
;
SHINOTSUKA, Hiroshi (author) (Search by this author)ナノ計測センター/先端表面化学分析グループ, National Institute for Materials Science
;
DA, Bo (author) (Search by this author)表面化学分析グループ, National Institute for Materials Science
;
YOSHIKAWA, Hideki (author) (Search by this author)表面化学分析グループ, National Institute for Materials Science
;
パウエル (author) (Search by this author)NIST
- Keyword
- IMFP, liquid water
- Date published
- Updated at
- 2023-06-29 11:55:58 +0900
Raw data files for Fig. 10 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
- Dataset
- Creator
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OGIWARA, Toshiya (author) (Search by this author)National Institute for Materials Science
;
NAGATA, Takahiro (author) (Search by this author)National Institute for Materials Science
;
YOSHIKAWA, Hideki (author) (Search by this author)National Institute for Materials Science
- Keyword
- Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
- Date published
- 2019-03-07
- Updated at
- 2024-01-05 22:12:41 +0900
Raw data files for Fig. 9 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
- Dataset
- Creator
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OGIWARA, Toshiya (author) (Search by this author)National Institute for Materials Science
;
NAGATA, Takahiro (author) (Search by this author)National Institute for Materials Science
;
YOSHIKAWA, Hideki (author) (Search by this author)National Institute for Materials Science
- Keyword
- Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
- Date published
- 2019-03-07
- Updated at
- 2024-10-08 12:20:27 +0900
Raw data files for Fig. 5 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
- Dataset
- Creator
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OGIWARA, Toshiya (author) (Search by this author)National Institute for Materials Science
;
NAGATA, Takahiro (author) (Search by this author)National Institute for Materials Science
;
YOSHIKAWA, Hideki (author) (Search by this author)National Institute for Materials Science
- Keyword
- Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
- Date published
- 2019-03-07
- Updated at
- 2024-03-30 18:50:38 +0900
Unveiling the principle descriptor for predicting the electron inelastic mean free path based on a machine learning framework
- Journal article
- Creator
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;Xun Liu (author) (Search by this author)National Institute for Materials Science;Zhufeng Hou (author) (Search by this author);Dabao Lu (author) (Search by this author)Bo Da (author) (Search by this author)National Institute for Materials Science
;
Hideki Yoshikawa (author) (Search by this author)National Institute for Materials Science
;
Shigeo Tanuma (author) (Search by this author)National Institute for Materials Science
;
;Yang Sun (author) (Search by this author)Zejun Ding (author) (Search by this author)
- Keyword
- machine learning, inelastic mean free path, LASSO
- Date published
- 2019-12-31
- Updated at
- 2024-09-05 16:30:30 +0900
Machine learning approach for the prediction of electron inelastic mean free paths
- Journal article
- Creator
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;Xun Liu (author) (Search by this author)National Institute for Materials Science;Lihao Yang (author) (Search by this author);Zhufeng Hou (author) (Search by this author)Bo Da (author) (Search by this author)National Institute for Materials Science
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Kenji Nagata (author) (Search by this author)National Institute for Materials Science
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Hideki Yoshikawa (author) (Search by this author)National Institute for Materials Science
;
Shigeo Tanuma (author) (Search by this author)National Institute for Materials Science
;
;Yang Sun (author) (Search by this author)Zejun Ding (author) (Search by this author)
- Keyword
- machine learning, inelastic mean free path
- Date published
- 2021-03-24
- Updated at
- 2024-01-05 22:13:49 +0900