2 件のレコードが見つかりました。
Calibration of binding energy and clarification of interfacial band bending for the Al2O3/diamond heterojunction
- ジャーナル論文
- 著者
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J. W. Liu (author) (この著者で検索)National Institute for Materials Science
;
T. Teraji (author) (この著者で検索)National Institute for Materials Science
;
B. Da (author) (この著者で検索)National Institute for Materials Science
;
Y. Koide (author) (この著者で検索)National Institute for Materials Science
- キーワード
- binding energy calibration, carbon-related materials, XPS, diamond, Band bending
- 刊行年月日
- 2024-09-02
- 更新時刻
- 2024-09-13 12:30:32 +0900
Summary of ISO/TC 201 Standard: XX ISO 18118: 2004 — Surface chemical analysis — Auger electron spectroscopy and X-ray photoelectron spectroscopy —Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials
- ジャーナル論文
- 著者
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TANUMA, Shigeo (author) (この著者で検索)
- キーワード
- XPS, quantitative surface analysis, X-ray photoelectron spectroscopy, Auger electron spectroscopy, relative sensitivity factor, ISO, International Organization for Standardization, AES
- 刊行年月日
- 2005-12-28
- 更新時刻
- 2024-01-05 22:11:34 +0900