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1348 件のレコードが見つかりました。
Influence of spacer layers on spin transport efficiency in heterostructures
- ジャーナル論文
- 著者
-
Nitipriya Tripathi (author) (この著者で検索)
https://orcid.org/0009-0001-8178-709X
(unauthenticated)
;
Shrawan K. Mishra (author) (この著者で検索)
https://orcid.org/0000-0001-6140-7443
(unauthenticated)
;
Shinji Isogami (author) (この著者で検索)
- キーワード
- Antiferromagnet, Spin Hall effect
- 刊行年月日
- 2026-01-30
- 更新時刻
- 2026-02-07 16:30:10 +0900
Observation of Plasmon Energy Gain for Emitted Secondary Electron in Vacuo
- ジャーナル論文
- 著者
-
Bo Da (author) (この著者で検索)National Institute for Materials Science
;
Jiangwei Liu (author) (この著者で検索)National Institute for Materials Science
;
Yoshitomo Harada (author) (この著者で検索)National Institute for Materials Science
;
;Nguyen T. Cuong (author) (この著者で検索)Kazuhito Tsukagoshi (author) (この著者で検索)National Institute for Materials Science
;
;Jin Hu (author) (この著者で検索);Lihao Yang (author) (この著者で検索);Zejun Ding (author) (この著者で検索)Hideki Yoshikawa (author) (この著者で検索)National Institute for Materials Science
;
Shigeo Tanuma (author) (この著者で検索)National Institute for Materials Science
- キーワード
- Secondary Electron, Plasmon Energy Gain
- 刊行年月日
- 2019-10-03
- 更新時刻
- 2024-01-05 22:11:31 +0900
Hydrogel beads as slow-release NH 4 + fertilizer and reducing S and Fe in soil acidity: alginate-poly(acrylic acid)-carboxymethyl cellulose-oleic acid
- ジャーナル論文
- 著者
-
;Endar Hidayat (author) (この著者で検索);Nur Ain Hannani Hamid (author) (この著者で検索);Nur Maisarah Mohamad Sarbani (author) (この著者で検索);Muhammad Aslam Mohd Safari (author) (この著者で検索);Mitsuru Aoyagi (author) (この著者で検索);Hiroyuki Harada (author) (この著者で検索)Sadaki Samitsu (author) (この著者で検索)
- キーワード
- Hydrogel beads, sulfur and iron contamination, immobilization, oleic acid, slow release fertilizer
- 刊行年月日
- 2025-05-04
- 更新時刻
- 2025-12-10 13:29:08 +0900
Raw data files for Fig. 12 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
- データセット
- 著者
-
OGIWARA, Toshiya (author) (この著者で検索)National Institute for Materials Science
;
NAGATA, Takahiro (author) (この著者で検索)National Institute for Materials Science
;
YOSHIKAWA, Hideki (author) (この著者で検索)National Institute for Materials Science
- キーワード
- Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
- 刊行年月日
- 2019-03-07
- 更新時刻
- 2024-01-05 22:13:20 +0900
Raw data files for Fig. 11 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
- データセット
- 著者
-
OGIWARA, Toshiya (author) (この著者で検索)National Institute for Materials Science
;
NAGATA, Takahiro (author) (この著者で検索)National Institute for Materials Science
;
YOSHIKAWA, Hideki (author) (この著者で検索)National Institute for Materials Science
- キーワード
- Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
- 刊行年月日
- 2019-03-07
- 更新時刻
- 2024-04-07 22:57:41 +0900
Raw data files for Fig. 10 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
- データセット
- 著者
-
OGIWARA, Toshiya (author) (この著者で検索)National Institute for Materials Science
;
NAGATA, Takahiro (author) (この著者で検索)National Institute for Materials Science
;
YOSHIKAWA, Hideki (author) (この著者で検索)National Institute for Materials Science
- キーワード
- Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
- 刊行年月日
- 2019-03-07
- 更新時刻
- 2024-01-05 22:12:41 +0900
Raw data files for Fig. 9 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
- データセット
- 著者
-
OGIWARA, Toshiya (author) (この著者で検索)National Institute for Materials Science
;
NAGATA, Takahiro (author) (この著者で検索)National Institute for Materials Science
;
YOSHIKAWA, Hideki (author) (この著者で検索)National Institute for Materials Science
- キーワード
- Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
- 刊行年月日
- 2019-03-07
- 更新時刻
- 2024-10-08 12:20:27 +0900
Raw data files for Fig. 5 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
- データセット
- 著者
-
OGIWARA, Toshiya (author) (この著者で検索)National Institute for Materials Science
;
NAGATA, Takahiro (author) (この著者で検索)National Institute for Materials Science
;
YOSHIKAWA, Hideki (author) (この著者で検索)National Institute for Materials Science
- キーワード
- Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
- 刊行年月日
- 2019-03-07
- 更新時刻
- 2024-03-30 18:50:38 +0900
Raw data files for Fig. 6 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
- データセット
- 著者
-
OGIWARA, Toshiya (author) (この著者で検索)National Institute for Materials Science
;
NAGATA, Takahiro (author) (この著者で検索)National Institute for Materials Science
;
YOSHIKAWA, Hideki (author) (この著者で検索)National Institute for Materials Science
- キーワード
- Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
- 刊行年月日
- 2019-03-07
- 更新時刻
- 2024-03-30 18:50:25 +0900
Raw data files for Fig. 7 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
- データセット
- 著者
-
OGIWARA, Toshiya (author) (この著者で検索)National Institute for Materials Science
;
NAGATA, Takahiro (author) (この著者で検索)National Institute for Materials Science
;
YOSHIKAWA, Hideki (author) (この著者で検索)National Institute for Materials Science
- キーワード
- Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
- 刊行年月日
- 2019-03-07
- 更新時刻
- 2024-01-05 22:12:25 +0900