Development of automated tip preparation for atom probe tomography by using script-controlled FIB-SEM
- ジャーナル論文
- 著者
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Jun Uzuhashi (author) (この著者で検索)National Institute for Materials Science
;
Tadakatsu Ohkubo (author) (この著者で検索)National Institute for Materials Science
;
Kazuhiro Hono (author) (この著者で検索)National Institute for Materials Science
- キーワード
- atom probe tomography, focused ion beam, scanning electron microscopy, automation
- 刊行年月日
- 2023-02-19
- 更新時刻
- 2025-02-23 22:51:16 +0900
Atomic Diffusion of Indium through Threading Dislocations in InGaN Quantum Wells
- ジャーナル論文
- 著者
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;Yudai Yamaguchi (author) (この著者で検索);Yuya Kanitani (author) (この著者で検索);Yoshihiro Kudo (author) (この著者で検索)Jun Uzuhashi (author) (この著者で検索)National Institute for Materials Science
;
Tadakatsu Ohkubo (author) (この著者で検索)National Institute for Materials Science
;
Kazuhiro Hono (author) (この著者で検索)National Institute for Materials Science
;
Shigetaka Tomiya (author) (この著者で検索)
- キーワード
- InGaN, dislocation, pipe diffusion, atom probe tomography, transmission electron microscopy
- 刊行年月日
- 2022-09-14
- 更新時刻
- 2024-01-05 22:12:51 +0900